Rockford, IL Certification

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z540-1-1994 (R2002) AND ANSI/NCSL Z540.3-2006 (R2013)

Technical Maintenance, Inc.
3248 Forest View Road Rockford, IL 61109
Scott Chamberlain 779-774-3877

CALIBRATION

Valid to: September 20, 2018 Certificate Number: AC-2080.03

Acoustics and Vibration

Parameter/Equipment Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Accelerometers – Acceleration (7 to 200) Hz

(100 to 2 500) Hz

(2.5 to 10) kHz

(0.01 to 10) g 1.5 % of reading

1.2 % of reading

2.5 % of reading

Accelerometer Calibrator

 

Chemical Quantities

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

pH3

(4, 7, 10) pH

0.019 pH

Buffer Solutions

Conductivity3

99.8 µS 998 µS

10 007 µS

0.38 µS

4.1 µS 37 µS

Conductivity Solutions

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

DC Current – Generate3

Up to 220 µA (0.22 to 2.2) mA

(2.2 to 22) mA

(22 to 220) mA

(0.22 to 2.2) A

55 µA/A + 6 nA

50 µA/A + 7 nA

50 µA/A + 40 nA

60 µA/A + 0.7 µA

98 µA/A + 12 µA

Fluke 5522A

(2.2 to 11) A

0.037% of reading + 480 µA

Fluke 5720A/5725A

(11 to 20.5) A

0.11 % of reading + 750 µA

Fluke 5522A

DC Current – Generate3 Clamp Only

(20.5 to 1000) A

0.9 % of reading

Fluke 5522A/Coil5500A

DC Current – Measure3

Up to 100 nA 100 nA to 1 µA

(1 to 10) µA

(10 to 100) µA

100 µA to 10 mA

(10 to 100) mA

100 mA to 1 A

36 μA/A + 0.04 nA

24 μA/A + 0.04 nA

24 μA/A + 0.1 nA

24 μA/A + 0.8 nA

25 μA/A + 0.05 μA

43 μA/A + 0.5 μA

0.14 mA/A + 10 μA

Agilent 3458A

(1 to 500) A

0.32 % of reading

Current Shunt

DC Voltage3 – Generate

Up to 220 mV (0.22 to 2.2) V

(2.2 to 11) V

(11 to 22) V

(22 to 220) V

(220 to 1 100) V

11 µV/V + 0.4 µV

8.2 µV/V + 0.7 µV

7.1 µV/V + 2.5 µV

7.1 µV/V + 4 µV

8.2 µV/V + 40 µV

10 µV/V + 0.4 mV

Fluke 5720A

DC Voltage3 – Measure

Up to 100 mV 100 mV to 1V (1 to 10) V

(10 to 100) V

(100 to 1 000) V

18 μV/V + 0.3 μV

11 μV/V + 0.3 μV

11 μV/V + 0.5 μV

13 μV/V + 30 μV

13 μV/V + 0.1 mV

Agilent 3458A

(1 to 120) kV

0.37 % of reading

Ross VD120

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Voltage – Generate3

Up to 22 mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(22 to 220) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

220 mV to 2.2 V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(2.2 to 22) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

0.36 mV/V + 5 µV

0.15 mV/V + 5 µV

0.13 mV/V + 5 µV

0.3 mV/V + 5 µV

0.71 mV/V + 6 µV

1.6 mV/V + 12 µV 2 mV/V + 25 µV 4 mV/V + 25 µV

0.35 mV/V + 15 µV

0.14 mV/V + 8 µV

0.12 mV/V + 8 µV

0.29 mV/V + 8 µV

0.7 mV/V + 20 µV

1.3 mV/V + 25 µV 2 mV/V + 30 µV

3.9 mV/V + 60 µV

0.51 mV/V + 50 µV

0.4 mV/V + 20 µV

0.38 mV/V + 10 µV

1.4 mV/V + 12 µV

0.41 mV/V + 40 µV

0.69 mV/V + 0.1 mV

1.5 mV/V + 0.25 mV

2.4 mV/V + 0.4 mV

0.48 mV/V + 0.5 mV

0.39 mV/V + 0.2 mV

0.38 mV/V + 70 µV

0.39 mV/V + 0.12 mV

0.4 mV/V + 0.25 mV

0.5 mV/V + 0.8 mV

1.3 mV/V + 2.5 mV

1.9 mV/V + 4 mV

Fluke 5720A

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Voltage – Generate3

(22 to 220) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

0.51 mV/V + 5 mV

0.4 mV/V + 2 mV

    1. mV/V + 0.7 mV

    2. mV/V + 1.2 mV

0.43 mV/V + 3 mV

1.4 mV/V + 20 mV

6.3 mV/V + 50 mV 12 mV/V + 0.1 V

Fluke 5720A

(220 to 1 100) V

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 30) kHz

(220 to 750) V

(30 to 50) kHz

(50 to 100) kHz

    1. mV/V + 0.7 mV

    2. mV/V + 1.2 mV

0.43 mV/V + 3 mV

0.39 mV/V + 1.2 mV

0.43 mV/V + 3 mV

Fluke 5720A/5725A

AC Voltage – Measure3

Up to 10 mV

(1 to 40) Hz

(40 to 100) Hz

100 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 250) kHz

10 mV to 100 mV

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(1 to 2) MHz

0.044 % of reading + 0.003 mV

0.026 % of reading + 0.0011 mV

0.044 % of reading + 0.0011 mV

0.11 % of reading + 0.0011 mV

0.5 % of reading + 0.0011 mV 4 % of reading + 0.002 mV

0.019 % of reading + 0.004 mV

0.019 % of reading + 0.002 mV

0.027 % of reading + 0.002 mV

0.045 % of reading + 0.002 mV

0.09 % of reading + 0.002 mV

0.31 % of reading + 0.01 mV 1 % of reading + 0.01 mV

1.5 % of reading + 0.01 mV

Agilent 3458A

 

Parameter/Equipment Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Voltage – Measure3

100 mV to 1 V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(1 to 2) MHz

1 V to 10 V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(1 to 2) MHz

(10 to 100) V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(100 to 700) V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

0.019 % of reading + 0.04 mV

0.019 % of reading + 0.02 mV

0.027 % of reading + 0.02 mV

0.045 % of reading + 0.02 mV

0.09 % of reading + 0.02 mV

0.31 % of reading + 0.1 mV 1 % of reading + 0.1 mV

1.5 % of reading + 0.1 mV

0.019 % of reading + 0.0004 V

0.019 % of reading + 0.0002 V

0.027 % of reading + 0.0002 V

0.045 % of reading + 0.0002 V

0.09 % of reading + 0.0002 V

0.31 % of reading + 0.001 V 1 % of reading + 0.001 V

1.5 % of reading + 0.001 V

0.026 % of reading + 0.002 V

0.041 % of reading + 0.002 V

0.038 % of reading + 0.002 V

0.048 % of reading + 0.002 V

0.13 % of reading + 0.002 V

0.4 % of reading + 0.01 V

1.5 % of reading + 0.01 V

0.05 % of reading + 0.04 V

0.05 % of reading + 0.02 V

0.07 % of reading + 0.02 V

0.13 % of reading + 0.02 V

0.3 % of reading + 0.02 V

Agilent 3458A

(1 to 85) kV

(50, 60) Hz

0.62 % of reading

Ross VD120 w/34401A

 

Parameter/Equipment Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Current – Generate3

Up to 200 µA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(0.2 to 2.2) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(2.2 to 22) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(22 to 200) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(0.2 to 2.2) A

20 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

0.36 mA/A + 20 nA

0.25 mA/A + 12 nA

0.19 mA/A + 10 nA

0.42 mA/A + 15 nA

1.6 mA/A + 80 nA

0.36 mA/A + 50 nA

0.25 mA/A + 40 nA

0.18 mA/A + 40 nA 0.3 mA/A + 0.18 µA 1.6 mA/A + 0.8 µA

0.26 mA/A + 0.5 µA

0.24 mA/A + 0.4 µA

0.18 mA/A + 0.4 µA 0.3 mA/A + 0.7 µA

1.6 mA/A + 6 µA

0.36 mA/A + 5 µA

0.24 mA/A + 4 µA

0.18 mA/A + 3 µA

0.3 mA/A + 4 µA

1.6 mA/A + 12 µA

0.28 mA/A + 40 µA

0.6 mA/A + 0.1 mA

9.3 mA/A + 0.2 mA

Fluke 5720A

(2.2 to 11) A

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

0.81 mA/A + 0.17 mA

1.3 mA/A + 0.38 mA

4.3 mA/A + 0.75 mA

Fluke 5720A/5725A

(11 to 20.5) A

(45 to 100) Hz

100 Hz to 1 kHz

(1 Hz to 5) kHz

0.1 % of reading + 2 mA

0.12 % of reading + 5 mA

2.28 % of reading + 5 mA

Fluke 5522A

AC Current – Generate3 Clamp Only

(20.5 to 1 000) A

(45 to 440) Hz

1.5 % of reading + 0.9 A

Fluke 5520A/coil

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Current – Measure3

Up to 100 μA

(10 to 20) Hz

(20 to 45) Hz

45 Hz to 1 kHz

(1 to 100) mA

(10 to 20) Hz

(20 to 45) Hz

(45 to 100) Hz

100 Hz to 5 kHz

(5 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(0.1 to 1) A

(10 to 20) Hz

(20 to 45) Hz

(45 to 100) Hz

100 Hz to 5 Hz

(5 to 20) kHz

(20 to 50) kHz

0.41 % of reading + 0.03 pA

0.16 % of reading + 0.03 pA

0.07 % of reading + 0.03 pA

0.41 % of reading + 20 μA

0.16 % of reading + 20 μA

0.069 % of reading + 20 μA

0.038 % of reading + 20 μA

0.069 % of reading + 20 μA

0.41 % of reading + 40 μA

0.56 % of reading + 0.15 mA

0.41 % of reading + 0.2 mA

0.17 % of reading + 0.2 mA

0.087 % of reading + 0.2 mA

0.11 % of reading + 0.2 mA

0.31 % of reading + 0.2 mA 1 % of reading + 0.4 mA

Agilent 3458A

(2 to 30) A

Up to 1 kHz (1 to 5) kHz

0.36 % of reading

5.8 % of reading

Current Shunt

Resistance3 – Fixed Points

1 Ω, 1.9 Ω

10 Ω, 19 Ω

100 Ω, 190 Ω

1 kΩ, 1.9 kΩ

10 kΩ, 19 kΩ

100 kΩ, 190 kΩ

1 MΩ

1.9 MΩ 10 MΩ 19 MΩ

100 MΩ

0.12 mΩ/Ω 31 μΩ/Ω 23 μΩ/Ω 12 μΩ/Ω 13 μΩ/Ω 14 μΩ/Ω 24 μΩ/Ω 26 μΩ/Ω 50 μΩ/Ω 59 μΩ/Ω

0.14 mΩ/Ω

Fluke 5720A

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Resistance – Generate3

Up to 11 Ω

(11 to 33) Ω

(33 to 110) Ω

(110 to 330) Ω

330 Ω to 1.1 kΩ

(1.1 to 3.3) kΩ

(3.3 to 11) kΩ

(11 to 33) kΩ

(33 to 110) kΩ

(110 to 330) kΩ

0.33 MΩ to 1.1 MΩ (1.1 to 3.3) MΩ (3.3 to 11) MΩ (11 to 33) MΩ (33 to 110) MΩ

(110 to 330) MΩ

330 MΩ to 1.1 GΩ

51 μΩ/Ω + 0.01 Ω

42μΩ/Ω + 0.015 Ω

33 μΩ/Ω + 0.015 Ω

33 μΩ/Ω + 0.02 Ω

33 μΩ/Ω + 0.02 Ω

34 μΩ/Ω + 0.2 Ω

34 μΩ/Ω + 0.1 Ω

34 μΩ/Ω + 1 Ω

33 μΩ/Ω + 1 Ω

40 μΩ/Ω + 10 Ω

38μΩ/Ω + 10 Ω

70 μΩ/Ω + 0.15 kΩ

0.15 mΩ/Ω + 0.25 kΩ

0.3 mΩ/Ω + 2.5 kΩ

0.61 mΩ/Ω + 3 kΩ

3.5 mΩ/Ω + 0.1 MΩ 17 mΩ/Ω + 0.5 MΩ

Fluke 5522A

Resistance – Measure3

Up to 10 Ω (10 to 100) Ω

100 Ω to 1 kΩ

(1 to 10) kΩ

(10 to 100) kΩ

100 kΩ to 1 MΩ

(1 to 10) MΩ

(10 to 100) MΩ

100 MΩ to 1 GΩ

18 μΩ/Ω + 50 μΩ

16 μΩ/Ω + 0.5 mΩ

13 μΩ/Ω + 0.5 mΩ

14 μΩ/Ω + 5 mΩ

13 μΩ/Ω + 50 mΩ

18 μΩ/Ω + 2 Ω

58 μΩ/Ω + 100 Ω

    1. mΩ/Ω + 1 kΩ

    2. % of reading + 10 kΩ

Agilent 3458A

Capacitance – Generate3 Fixed Points

1 pF

10 pF

100 pF

1 000 pF

0.41 % of reading 017 % of reading

0.13 % of reading

0.32 % of reading

Agilent 16380A

Capacitance – Generate3

(220 to 400) pF

(0.4 to 3.3) nF

(3.3 to 33) nF

(33 to 330) nF

(0.33 to 3.3) μF

(3.3 to 11) μF

(11 to 33) μF

(33 to 110) μF

1.9 % of reading + 0.01 nF

0.85 % of reading + 0.01 nF

0.37 % of reading + 0.01 nF

0.32 % of reading + 0.3 nF

0.32 % of reading + 3 nF

0.32 % of reading + 3 nF

0.48 % of reading + 30 nF

0.55 % of reading + 0.1 µF

Fluke 5522A

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Capacitance – Generate3

(110 to 329.999) μF

(0.33 to 1.1) mF

(1.1 to 3.3) mF

(3.3 to 11) mF

(11 to 33) mF

(33 to 110) mF

0.53 % of reading + 0.3 µF

0.53 % of reading + 1 μF

0.53 % of reading + 3 μF

0.53 % of reading + 10 μF

0.88 % of reading + 30 μF

1.3 % of reading + 0.1 mF

Fluke 5522A

Capacitance – Measure3 50Hz – 100kHz

0.1 pF to 1 μF (1 to 10) μF

10 μF to 10 mF

0.7 % of reading

1.3 % of reading 12 % of reading

Fluke PM 6304C

Electrical Calibration of Thermocouple Indicating Devices3

Type B

(600 to 1 820) °C

Type C

(0 to 2 316) °C

Type E

(-250 to 1 000) °C

Type J

(-210 to 1 200) °C

Type K

(-200 to 1 372) °C

Type L

(-200 to 900) °C

Type N

(-200 to 1 300) °C

Type R

(0 to 1 767) °C

Type S

(0 to 1 767) °C

Type T

(-250 to -200) °C

(-200 to 400) °C

Type U

(-200 to 600) °C

0.41 °C

0.38 °C

0.29 °C

0.19 °C

0.21 °C

0.12 °C

0.26 °C

0.45 °C

0.44 °C

0.41 °C

0.2 °C

0.19 °C

Fluke 7526A

Inductance – Measure3 Up to 1 kHz

10 µH to 637 kH

0.07 % of reading

Fluke PM 6304C

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Oscilloscope Calibration – Vertical Deflection3

50 Ω, 1 kHz square wave

1 MΩ, 1 kHz square wave

Flatness – Leveled Sine Wave

5 mV to 5.5 V ref @ 50 kHz BANDWIDTH

Rise Time Time Interval2

1 mV to 6.6 V

1 mV to 130 V

50 kHz to 100 MHz

(100 to 300) MHz

(300 to 600) MHz

(600 to 1100) MHz

<300 ps

(1 to 20) ms

50 ms to 5 s

0.64 % of reading + 40 µV

0.79 % of reading + 40 µV

2.5 % of reading + 0.1 mV

2.2 % of reading + 0.1 mV

4.6 % of reading + 0.1 mV

6.4 % of reading + 0.1 mV

+ 33 ps / -120 ps

3 µs/s

(25 + 1 000t) µs/s

Fluke 5522A/SC1100

Flatness – Measure

100 mV to 1 V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(1 to 2) MHz

(1 to 10) V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(1 to 2) MHz

0.027 % of reading + 0.04 mV

0.013 % of reading + 0.02 mV

0.019 % of reading + 0.02 mV

0.036 % of reading + 0.02 mV

0.94 % of reading + 0.02 mV

0.35 % of reading + 0.1 mV

1.2 % of reading + 0.1 mV

1.7 % of reading + 0.1 mV

0.027 % of reading + 0.4 mV

0.013 % of reading + 0. 2 mV

0.019 % of reading + 0.2 mV

0.036 % of reading + 0.2 mV

0.94 % of reading + 0.2 mV

0.35 % of reading + 1 mV

1.2 % of reading + 1 mV

1.7 % of reading + 1 mV

Fluke 3458A

Power Meter Range Calibration3

3 µW to 100 mW

0.3 % of reading

HP 11683A

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Amplitude Modulation3 – Measure

10 kHz to 10 MHz

10 MHz to 3 GHz

(3 to 26.5) GHz

(5 to 99) %Depth

(5 to 20) %Depth

(20 to 99) %Depth

(5 to 20) %Depth

(20 to 99) %Depth

1 %Depth

2.9 %Depth

0.8 %Depth

5.2 %Depth

1.8 %Depth

Agilent E4440A

Frequency Modulation3 – Measure

250 kHz to 10 MHz

10 MHz to 6.6 GHz

(6.6 to 13.2) GHz

(13.2 to 26.5) GHz

250 Hz to 10 kHz

50 Hz to 200 kHz

3.1 % of reading

3.1 % of reading

3.8 % of reading 5 % of reading

Agilent E4440A

Attenuation3 – Measure 10 MHz to 26.5 GHz

(-10 to 0) dB

(-20 to -11) dB

(-30 to -21) dB

(-40 to -31) dB

(-50 to -41) dB

(-60 to -51) dB

(-70 to -61) dB

(-80 to -71) dB

(-90 to -81) dB

(-100 to -91) dB

(-110 to -101) dB

(-120 to -111) dB

0.039 dB

0.039 dB

0.039 dB

0.039 dB

0.039 dB

0.05 dB

0.05 dB

0.05 dB

0.05 dB

0.05 dB

0.059 dB

0.059 dB

Agilent E4440A w/ N5532B Sensor

Flatness – Measure

(0.1 to 1) V

300 kHz to 26.5 GHz

(1 to 10) V

300 kHz to 26.5 GHz

5.4 % of reading + 0.1 mV

5.4 % of reading + 1 mV

HP 8482A/8485A

AM Distortion3 – Measure

(0.3to 10) MHz

10 MHz to 26.5 GHz

1.2 % of reading

1.5 % of reading

Agilent E4440A

FM Distortion3 – Measure

1 MHz to 50 GHz

0.5 % of reading

Agilent E4440A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

RF Power3 – Measure 100 kHz to 4.2 GHz

10 MHz to 26.5 GHz

(-10 to 20) dBm

4.9 % of reading

5.4 % of reading

HP 8482A HP 8485A

Phase Noise3 – SSB Measure

1 MHz to 50 GHz

0.45 dB

Agilent E4440A

AM/FM Distortion3

400 Hz to 1 kHz

1.2 dB

HP 8903B

Harmonic Distortion3

20 Hz to 20 kHz

20 kHz to 26.5 GHz

    1. dB

    2. dB

Agilent E4440A

 

Length – Dimensional metrology

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Gage Blocks2

Up to 14 in

(4.4+ 1.2L) µin

Master gage blocks, P&W

universal measuring machine

Micrometers2,3

Up to 46 in

(30 + 4L) µin

Gage blocks (Grade 0)

Calipers2,3

Up to 46 in

(58 + 7L) µin

Gage blocks (Grade 0)

Dial Indicators2,3

Up to 10 in

(120 + 42L) µin

716 Starrett Calibrator, gage blocks (Grade 0)

Micrometer Rods

Up to 40 in

(250 + 4L) µin

Gage blocks (grade 0)

Height Gages2,3

Up to 40 in

(190 + 3L) µin

Gage blocks (grade 0)

Cylindrical Gages 2

Ring Gages Plain Plugs/Pins

(0.04 to 14) in Up to 13 in

(4 + 3D) μin (7 + 2D) μin

Master gage blocks, P&W universal measuring machine

Thread Plugs –

Major Diameter Pitch Diameter

Up to 12 in Up to 12 in

130 µin

160 µin

P & W Model C, Van Keuren thread wire set

Thread Rings

Up to 12 in

54 µin

Thread setting plug gages

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Surface Plates2,3 Overall Flatness

Local Area Flatness

Up to 10 ft x 10 ft

± 0.002 in

72 μin + 1.2DL

69 µin

Mahr federal level system Repeat-O-Meter

Rulers3

Up to 46 in

0.009 in

Gage blocks (grade 0)

Feeler Gage3

Up to 1 in

74 µin

Pratt & Whitney Model C

Optical Comparators3 – Linearity

Magnification

Up to 20 in (20 to 40) in

10x to 100x

590 μin

790 μin

590 μin

Gage blocks,

SI Industries glass scales

 

Mass

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Scales & Balances2,3

(2 to 10) g

(10 to 50) g

(50 to 200) g

(200 to 500) g

(0.5 to 2) kg

Up to 500 lb

0.06 mg + 0.6R

0.09 mg + 0.6R

0.41 mg + 0.6R 10 mg + 0.6R 13 mg + 0.6R

27 g + 0.6R

Class F weights

Pressure3

(-11 to 15) psi

(15 to 100) psi

(100 to 300) psi

(10 to 16 000) psi

0.005 3 psi

0.036 psi

0.094 psi

0.04 % of reading

Pressure transducers 2700G-BG100K, 2700G- BG700K, 2700G-BG2M

Mdl P3125

Force – Tension and Compression3

(0.01 to 500) lbf

0.001 3 % of reading

Class F weights

(200 to 10 000) lbf

0.11 % of reading

Morehouse Press with

Load Cells

Torque3

4 lbfin to 1 000 lbfft

0.5 % of reading

CDI 5000 ST torque tester

Torque Analyzers

0.4 ozf-in to 1 000 lbfft

0.13 % of reading

Class F weights and arm

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Relative Humidity – Generate

(10 to 95) %RH

0.51 %RH

Thunder Scientific 1200

Relative Humidity –

Measure

(0 to 90) %RH

1.7 %RH

Vaisala HM141/HMP46

Temperature – Measuring Equipment3

(-25 to 140) °C

0.13 °C

1502A with 5615 SPRT

and dry block

Temperature – Measure3

(-200 to 420) °C

0.04 °C

Hart 1502A/5615 SPRT

 

Time and Frequency

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Frequency – Measure

10 MHz

1 x 10-11 Hz/Hz

58503A/B GPS

Frequency – Measure3

10 Hz to 225 MHz

225 MHz to 26.5 GHz

3 x 10-9 Hz/Hz

2 x 10-7 Hz/Hz

HP 53131A, E4440A

Calibration and Measurement Capability (CMC) is expressed in terms of the measurement parameter, measurement range, expanded uncertainty of measurement and reference standard, method, and/or equipment. The expanded uncertainty of measurement is expressed as the standard uncertainty of the measurement multiplied by a coverage factor of 2 (k=2), corresponding to a confidence level of approximately 95%.

Notes:

  1. On-site calibration service is available for this parameter, since on-site conditions are typically more variable than those in the laboratory, larger measurement uncertainties are expected on-site than what is reported on the accredited scope.

  2. L = length in inches, D = diameter in inches, R = resolution of device under test, t = time in seconds, DL = diagonal length in inches.

  3. This scope is formatted as part of a single document including Certificate of Accreditation No. AC-2080.03.


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