Temple Terrace, FL Certification

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z540-1-1994 (R2002) AND ANSI/NCSL Z540.3-2006 (R2013)

Technical Maintenance, Inc.
12530 Telecom Drive
Temple Terrace, FL 33637
Scott Chamberlain 813-978-3054

CALIBRATION

Valid to: September 20, 2019

Certificate Number: AC-2080

Acoustics and Vibration

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Accelerometers – Acceleration (7 < 10) Hz

(10 < 30) Hz

(30 < 2000) Hz

(2 to 10) kHz

(0.01 to 10) g

4 % of reading 3 % of reading

1.5 % of reading 4 % of reading

Accelerometer Calibrator

Chemical Quantities

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

pH meters1

(4, 7, 10) pH

0.02 pH

pH buffer solutions

Conductivity Meters1

2 µS

10 µS

100 µS

1 000 µS

10 000 µS

0.52 µS

0.25 µS

0.47 µS

2.8 µS 95 µS

Conductivity solutions

image

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Phase Angle – Generate

1 Hz to 1 kHz

1 to 6.25 kHz

6.25 to 50 kHz 50 to 200 kHz

1 Hz to 1 kHz

1 to 6.25 kHz

6.25 to 50 kHz 50 to 200 kHz

(0 to 360) °

5 V Equal Amplitude

(0 to 360) °

50 mV to 100 V

0.005 °

0.01 °

0.016 °

0.04 °

0.006 °

0.01 °

0.017 °

0.057 °

Clarke-Hess 5500-2

Phase Angle – Measure

5 Hz to 2 kHz

2 to 5 kHz

5 to 10 kHz

10 to 50 kHz

50 to 100 kHz

100 to 200 kHz

0° to 360°

10 mV to 350 V

0.02 °

0.03 °

0.04 °

0.05 °

0.1 °

0.2 °

Clarke-Hess 6000A

DC Current – Generate1

Up to 220 μA 220 μA to 2.2 mA

2.2 to 22 mA 22 to 220 mA

220 mA to 2.2 A

40 µA/A + 6 nA

35 µA/A + 7 nA

36 µA/A + 40 nA

48 µA/A + 0.7 µA

81 µA/A + 12 µA

Fluke 5730A

(2.2 to 11) A

370 µA/A + 480 µA

Fluke 5730A/5725A

(11 to 20.5) A

(20 to 100) A

77 µA/A + 1 mA

79 µA/A + 6 mA

Fluke 5522A/52120A

DC Current Clamp Meters

Toroidal

(100 to 550) A

(500 to 1 025) A

    1. % of reading + 0.08A

    2. % of reading + 0.09A

Fluke 5522A/Coil5500A

DC Current Clamp Meters

Non-Toroidal

(100 to 550) A

(500 to 1 025) A

    1. % of reading + 0.53A

    2. % of reading + 0.54A

Fluke 5522A/52120A/6KA/Coil

DC Current – Measure1

(0.004 to 220) μA

220 μA to 2.2 mA

(2.2 to 22) mA

(22 to 220) mA

6 µA/A

  1. µA/A

  2. µA/A

10 µA/A

Fluke 8508A/5450A

(0.22 to 2.2) A

(2.2 to 25) A

37 µA/A

25 µA/A

Fluke 8508A/Guildline 9230A

(25 to 100) A

(100 to 1 000) A

0.25 % of reading

1.5 % of reading + 0.5A

Fluke 8508A/Empro 250A

Fluke 376 Clamp

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

DC Voltage1 – Generate

0 to 220 mV

220 mV to 2.2 V

(2.2 to 11) V

(11 to 22) V

(22 to 220) V

(220 to 1 100) V

11 µV/V + 0.4 µV

5.2 µV/V + 0.7 µV

3.5 µV/V + 2.5 µV

3.5 µV/V + 4 µV

5.0 µV/V + 40 µV

6.5 µV/V + 400 µV

Fluke 5730A

DC Voltage1 – Measure

Up to 200 mV 200 mV to 2 V

(2 to 20) V

(20 to 200) V

(200 to 1 000) V

15 µV/V + 100 nV

3.8 µV/V + 400 nV

3.5 µV/V + 4 µV

5.5 µV/V + 40 µV

5.5 µV/V + 500 µV

Fluke 8508A

(1 to 120) kV

0.23 % of reading

Ross VD120/ HP34401A

DC Voltage1 – Measure Fixed Points

100 mV

1V

10V

100V

1 000V

2.9 µV/V

0.83 µV/V

0.33 µV/V

0.5 µV/V

0.73 µV/V

Fluke 732A/752A

AC Voltage – Generate1

(0.22 to 2.2) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(2.2 to 22) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

0.027 % of reading + 4 μV

0.014 % of reading + 4 μV

0.013 % of reading + 4 μV

0.022 % of reading + 4 μV

0.052 % of reading + 5 μV

0.11 % of reading + 10 μV

0.14 % of reading + 20 μV

0.27 % of reading + 20 μV

0.024 % of reading + 4 μV 91 μV/V + 4 μV

81 μV/V + 4 μV

0.02 % of reading + 4 μV

0.05 % of reading + 5 μV

0.1 % of reading + 10 μV

0.14 % of reading + 20 μV

0.27 % of reading + 20 μV

Fluke 5730A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Voltage – Generate1

(22 to 220) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

220 mV to 2.2 V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(2.2 to 22) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(22 to 220) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

0.024 % of reading + 12 μV 90 μV/V + 7 μV

58 μV/V + 7 μV

0.012 % of reading + 7 μV

0.031 % of reading + 17 μV

0.066 % of reading + 20 μV

0.14 % of reading + 25 μV

0.27 % of reading + 45 μV

0.024 % of reading + 40 μV 90 μV/V + 15 μV

43 μV/V + 8 μV

67 μV/V + 10 μV

85 μV/V + 30 μV

0.034 % of reading + 80 μV

0.1 % of reading + 200 μV

0.17 % of reading + 300 μV

0.024 % of reading + 400 μV 91 μV/V + 150 μV

43 μV/V + 50 μV

67 μV/V + 100 μV

83 μV/V + 200 μV

0.025 % of reading + 600 μV

0.1 % of reading + 2 mV

0.15 % of reading + 3.2 mV

0.024 % of reading + 4 mV 90 μV/V + 1.5 mV

52 μV/V + 0.6 mV

80 μV/V + 1 mV

0.015 % of reading + 2.5 mV

Fluke 5730A/5725A

AC Voltage – Generate1

(220 to 750) V

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

91 μV/V + 4 mV

0.017 % of reading + 6 mV

0.06 % of reading + 11 mV

0.23 % of reading + 45 mV

Fluke 5730A/5725A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Voltage – Generate1

(750 to 1 000) V

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 30) kHz

91 μV/V + 4 mV

0.017 % of reading + 6 mV

0.06 % of reading + 11 mV

Fluke 5730A/5725A

AC Voltage – Measure1

Up to 2.2 mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(2.2 to 7) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(7 to 22) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(22 to 70) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

0.13 % of reading + 1.3 μV

0.058 % of reading + 1.3 μV

0.034 % of reading + 1.3 μV

0.063 % of reading + 2 μV

0.093 % of reading + 2.5 μV

0.18 % of reading + 4 μV

0.18 % of reading + 8 μV

0.24 % of reading + 8 μV

0.065 % of reading + 1.3 μV

0.028 % of reading + 1.3 μV

0.016 % of reading + 1.3 μV

0.031 % of reading + 2 μV

0.046 % of reading + 2.5 μV

0.091 % of reading + 4 μV

0.099 % of reading + 8 μV

0.18 % of reading + 8 μV

0.022 % of reading + 1.3 μV

    1. % of reading + 1.3 μV 84 μV/V + 1.3 μV

    2. % of reading + 2 μV

0.024 % of reading + 2.5 μV

0.062 % of reading + 4 μV

0.068 % of reading + 8 μV

0.13 % of reading + 8 μV

0.018 % of reading + 1.5 μV 91 μV/V + 1.5 μV

50 μV/V + 1.3 μV

99 μV/V + 2 μV

0.02 % of reading + 2.5 μV

0.039 % of reading + 4 μV

0.051 % of reading + 8 μV

0.084 % of reading + 8 μV

Fluke 5790A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Voltage – Measure1

(70 to 220) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(220 to 700) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

700 mV to 2.2 V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(2.2 to 7) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

0.016 % of reading + 1.5 μV 65 μV/V + 1.5 μV

31 μV/V + 1.3 μV

27 μV/V + 2 μV

0.012 % of reading + 2.5 μV

0.019 % of reading + 4 μV

0.029 % of reading + 8 μV

0.076 % of reading + 8 μV

0.022 % of reading + 1.5 μV 91 μV/V + 1.5 μV

60 μV/V + 1.3 μV

72 μV/V + 2 μV

94 μV/V + 2.5 μV

0.019 % of reading + 4 μV

0.031 % of reading + 8 μV

0.097 % of reading + 8 μV

0.015 % of reading 50 μV/V

20 μV/V

35 μV/V

54 μV/V

0.012 % of reading

0.02 % of reading

0.069 % of reading

0.015 % of reading 51 μV/V

19 μV/V

37 μV/V

63 μV/V

0.015 % of reading

0.031 % of reading

0.091 % of reading

Fluke 5790A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Voltage – Measure1

(7 to 22) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(22 to 70) V

(10 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

(70 to 220) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(220 to 700) V

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(700 to 1 000) V

40 Hz to 20 kHz

(20 to 30) kHz

0.015 % of reading 52 μV/V

22 μV/V

37 μV/V

62 μV/V

0.015 % of reading

0.031 % of reading

0.091 % of reading

0.015 % of reading 52 μV/V

25 μV/V

44 μV/V

72 μV/V

0.015 % of reading

0.015 % of reading 53 μV/V

24 μV/V

53 μV/V

75 μV/V

35 μV/V

0.01 % of reading

0.038 % of reading

33 μV/V

0.01 % of reading

Fluke 5790A

AC Voltage – Measure1

(1 to 85) kV

(50, 60) Hz

0.67 % of reading

Ross VD120/ HP 34401A

AC Current – Measure1

(9 to 220) μA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

0.025 % of reading + 16 nA

0.016 % of reading + 10 nA

0.01 % of reading + 8 nA

0.028 % of reading + 12 nA

0.11 % of reading + 65 nA

Fluke 5730A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Current – Measure1

(0.22 to 2.2) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(2.2 to 22) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(22 to 220) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

0.025 % of reading + 40 nA

0.016 % of reading + 35 nA

    1. % of reading + 35 nA

    2. % of reading + 110 nA

0.011 % of reading + 650 nA

0.025 % of reading + 400 nA

0.016 % of reading + 350 nA

    1. % of reading + 350 nA

    2. % of reading + 550 nA

0.011 % of reading + 5 µA

0.025 % of reading + 4 μA

0.016 % of reading + 3.5 μA

    1. % of reading + 2.5 μA

    2. % of reading + 3.5 μA

0.11 % of reading + 10 μA

Fluke 5730A

AC Current – Generate1

(0.22 to 2.2) A

20 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(2.2 to 11) A

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

0.025 % of reading + 35 μA

0.045 % of reading + 80 μA

0.7 % of reading + 160 μA

0.046 % of reading + 170 μA

0.095 % of reading + 380 μA

0.36 % of reading + 750 μA

Fluke 5730A/5725A

AC Current – Generate1

(11 to 20.5) A

(45 to 100) Hz

100 Hz to 1 kHz

(1 Hz to 5) kHz

0.1 % of reading + 2 mA

0.12 % of reading + 5 mA

2.3 % of reading + 5 mA

Fluke 5520A

AC Current Clamps – Toroidal

Clamps -Non-Toroidal

(10 to 125) A

(45 to 65) Hz

(10 to 150) A

(65 to 440) Hz

(10 to 125) A

(45 to 65) Hz

(10 to 150) A

(65 to 440) Hz

0.24 % of reading +0.34A

0.61 % of reading +0.11A

0.44 % of reading +0.95A

0.76 % of reading +0.91A

Fluke 5522A/x50 Coil

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Current Clamps – Rogowski

(100 to 6000)A

(20 to 1 000) Hz

0.6 % of reading +0.3 A

Fluke 52120/6KA/Coil

AC Current – Measure1

Up to 200 μA

(1 to 10) Hz

10 Hz to 10 kHz

(10 to 30) kHz

(30 to 100) kHz

200 μA to 2 mA

(1 to 10) Hz

10 Hz to 10 kHz

(10 to 30) kHz

(30 to 100) kHz

0.054 % of reading + 0.02 μA

0.054 % of reading + 0.02 μA

0.074 % of reading + 0.02 μA

0.4 % of reading + 0.02 μA

0.032 % of reading + 0.2 μA

0.031 % of reading + 0.2 μA

0.072 % of reading+ 0.2 μA

0.4 % of reading + 0.2 μA

Fluke 8508A

AC Current – Measure1

(2 to 22) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 10) kHz

(10 to 50) kHz

(22 to 220) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 10) kHz

(10 to 50) kHz

0.021 % of reading

0.012 % of reading

0.01 % of reading

0.01 % of reading

0.014 % of reading

0.045 % of reading

0.042 % of reading

0.041 % of reading

0.041 % of reading

0.019 % of reading

Fluke 5790A / Holt HCS-1 Current Shunts

AC Current – Measure1

(0.22 to 2.2) A

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 10) kHz

(10 to 50) kHz

(2.2 to 20) A

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 10) kHz

86 μA/A

54 μA/A

48 μA/A

76 μA/A

0.019 % of reading

97 μA/A

64 μA/A

60 μA/A

91 μA/A

Fluke 5790A / Holt HCS-1 Current Shunts

AC Current – Measure1

(100 to 1 000) A

(10 to 100) Hz

(100 to 500) Hz

1.6 % of reading + 0.5A

1.9 % of reading+ 0.5A

Fluke 376

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Current – Measure1

(200 to 600) A

(10 to 500) Hz

(600 to 2 500) A

(10 to 500) Hz

2.3 % of reading + 0.5A

2.3 % of reading + 5A

Fluke 376 W/i2500 flex probe

Resistance – Generate, Fixed Points1

1 Ω

10 Ω

100 Ω

1 kΩ

10 kΩ

100 kΩ

1 MΩ

10 MΩ

19 MΩ

100 MΩ

1 GΩ

1.7 μΩ/Ω

1.6 μΩ/Ω

2.1 μΩ/Ω

1.3 μΩ/Ω

1.1 μΩ/Ω

4.2 μΩ/Ω

2.4 μΩ/Ω

5.6 μΩ/Ω

7.3 μΩ/Ω

34 μΩ/Ω

104 μΩ/Ω

Fluke 742A/ IET SRL

(1, 1.9) Ω

(10, 19) Ω

(100, 190) Ω

(1, 1.9) kΩ

(10, 19) kΩ

(100, 190) kΩ

1 MΩ

1.9 MΩ 10 MΩ 19 MΩ

100 MΩ

98 μΩ/Ω

23μΩ/Ω

10 μΩ/Ω

6.5 μΩ/Ω

6.5 μΩ/Ω

8.5 μΩ/Ω

13 μΩ/Ω

18 μΩ/Ω

40 μΩ/Ω

48 μΩ/Ω

100 μΩ/Ω

Fluke 5730A

Resistance – Generate1

Up to 11 Ω

(11 to 33) Ω

(33 to 110) Ω

(110 to 330) Ω

330 Ω to 1.1 kΩ

(1.1 to 3.3) kΩ

(3.3 to 11) kΩ

(11 to 33) kΩ

(33 to 110) kΩ

(110 to 330) kΩ

40 μΩ/Ω + 0.01 Ω

30 μΩ/Ω + 0.015 Ω

28 μΩ/Ω + 0.015 Ω

28 μΩ/Ω + 0.02 Ω

29 μΩ/Ω + 0.02 Ω

29 μΩ/Ω + 0.2 Ω

29 μΩ/Ω + 0.1 Ω

29 μΩ/Ω + 1 Ω

29 μΩ/Ω + 1 Ω

33 μΩ/Ω + 10 Ω

Fluke 5520A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Resistance – Generate1

(0.33 to 1.1) MΩ

(1.1 to 3.3) MΩ

(3.3 to 11) MΩ

(11 to 33) MΩ

(33 to 110) MΩ

(110 to 330) MΩ

(0.33 to 1.1 GΩ

33 μΩ/Ω + 10 Ω

60 μΩ/Ω + 150 Ω

0.013 % of reading + 250 Ω

0.025 % of reading + 2.5 kΩ

0.05 % of reading + 3 kΩ

0.3 % of reading + 100 kΩ

1.5 % of reading + 500 kΩ

Fluke 5520A

Resistance – Measure1 Fixed Points

1 Ω

10 Ω

100 Ω

1 kΩ

10 kΩ

100 kΩ

1 MΩ

10 MΩ

100 MΩ

1 GΩ

9.2 μΩ/Ω

3.7 μΩ/Ω

2.3 μΩ/Ω

1.5 μΩ/Ω

1.4 μΩ/Ω

4.4 μΩ/Ω

3.2 μΩ/Ω

6.1 μΩ/Ω

34 μΩ/Ω

194 μΩ/Ω

Fluke 8508A/ Fluke 742A/ IET SRL

Resistance – Measure1

Up to 2 Ω

(2 to 20) Ω

(20 to 200) Ω

200 Ω to 2 kΩ

(2 to 20) kΩ

(20 to 200) kΩ

200 kΩ to 2 MΩ

(2 to 20) MΩ

(20 to 200) MΩ

200 MΩ to 2 GΩ

(2 to 20) GΩ

19 μΩ/Ω + 4 µΩ

9.5 μΩ/Ω + 14 µΩ

8 μΩ/Ω + 50 µΩ

8 μΩ/Ω + 500 µΩ

8 μΩ/Ω + 5 mΩ

8 μΩ/Ω + 50 mΩ

9.0 μΩ/Ω + 1 Ω

17 μΩ/Ω + 10Ω

65 μΩ/Ω + 1kΩ

0.018 % of reading + 100 kΩ

0.15 % of reading + 10 MΩ

Fluke 8508A

Capacitance – Generate1

(0.19 to 0.109) nF

(1.1 to 3.299) nF

(3.3 to 329.999) nF

(0.33 to 1.099) μF

(1.1 to 3.299) μF

(3.3 to 10.999) μF

(11 to 32.999) μF

(33 to 109.999) μF

1.2 % of reading + 0.01 nF

1.2 % of reading + 0.01 nF

0.39 % of reading + 0.3 nF

0.38 % of reading + 3 nF

    1. % of reading + 3 nF

    2. % of reading + 10 nF

0.53 % of reading + 30 nF

0.58 % of reading + 100 nF

Fluke 5522A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Capacitance – Generate1

(110 to 329.999) μF

(0.33 to 1.099) mF

(1.1 to 3.299) mF

(3.3 to 10.999) mF

(11 to 32.999) mF

(33 to 110) mF

0.58 % of reading + 300 nF

    1. % of reading + 1 μF

    2. % of reading + 3 μF

    3. % of reading + 10 μF

0.65 % of reading + 30 μF

1.3 % of reading + 100 μF

Fluke 5522A

Capacitance – Measure 12 Hz to 200 kHz

0.000 01 pf to 99 999 µf

0.026 % of reading

IET 1693

Capacitance – Generate1 Fixed Points

1 pF

10 pF

100 pf

1 000 pF

0.41 % of reading

0.17 % of reading

0.13 % of reading

0.32 % of reading

Agilent 16380A

Inductance – Measure 12 Hz to 200 kHz

0.01 µH to 99 999 H

0.025 % of reading

IET 1693

Inductance – Generate 1 kHz

0.07 µH

0.1 µH

0.28 µH

0.52 µH 1 µH

2.5 µH

5.2 µH 10 µH 28 µH 56 µH 100 µH 250 µH 520 µH 1 mH

2.8 mH

5.2 mH

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

Agilent 16470A

Inductance – Generate 1 kHz

10 mH

25 mH

52 mH

0.032 % of reading

0.032 % of reading

0.032 % of reading

Agilent 16470A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Oscilloscope Calibration – Vertical Deflection1

50 Ω, 1 kHz square wave

1 MΩ, 1 kHz square wave Flatness – Leveled Sine Wave

Bandwidth Rise Time

Time Interval2

1 mV to 6.6 V

1 mV to 130 V

5 mV to 5.5 V

50 kHz to 100 MHz

(100 to 300) MHz

(300 to 600) MHz

(600 to 1100) MHz

<300 ps

1 ns to 20 ms

50 ms to 5 s

0.25 % of reading + 40 µV

0.1 % of reading + 40 µV

1.7 % of reading + 100 µV

2.2 % of reading + 100 µV

4.2 % of reading + 100 µV

5.2 % of reading + 100 µV

+ 13 ps / -101 ps

2.7 μs/s

(26 + 1 000t) μs/s

Fluke 5522A/SC1100

Power Meter Range Calibration1

3 μW to 100 mW

0.25 % of reading

HP 11683A

Electrical Calibration of Thermocouple Indicating Devices1

Type B

(600 to 1 820) °C

Type C

(0 to 2 316) °C

Type E

(-250 to 1 000) °C

Type J

(-210 to 1 200) °C

Type K

(-200 to 1 372) °C

Type L

(-200 to 900) °C

Type N

(-200 to 1 300) °C

0.41 °C

0.38 °C

0.29 °C

0.19 °C

0.21 °C

0.12 °C

0.26 °C

Fluke 7526A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Electrical Calibration of Thermocouple Indicating Devices1

Type R

(0 to 1 767) °C

Type S

(0 to 1 767) °C

Type T

(-250 to -200) °C

(-200 to 400) °C

Type U

(-200 to 600) °C

0.45 °C

0.44 °C

0.41 °C

0.2 °C

0.19 °C

Fluke 7526A

Electrical – RF/Microwave

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Flatness – Measure

1mV to 7 V

(10 to 30) Hz

(30 to 120) Hz

120 Hz to 1.2 kHz

(1.2 to 120) kHz

(120 to 500) kHz

500 kHz to 1.2 MHz

(1.2 to 2) MHz

(2 to 10) MHz

(10 to 20) MHz

(20 to 30) MHz

0.16 % of reading

0.04 % of reading

0.04 % of reading

0.04 % of reading

0.04 % of reading

0.06 % of reading

0.06 % of reading

0.12 % of reading

0.19 % of reading

0.43 % of reading

Fluke 5790A

Flatness – Measure

Up to 7 V

30 MHz to 50 GHz

6 % of reading

HP 8487A/8482A

Attenuation1 – Measure 100 kHz to 50 GHz

100 kHz to 50 GHz

100 kHz to 50 GHz

100 kHz to 50 GHz

100 kHz to 50 GHz

100 kHz to 50 GHz

100 kHz to 50 GHz

100 kHz to 45 GHz

100 kHz to 41 GHz

(-10 to 0) dB

(-20 to -11) dB

(-30 to -21) dB

(-40 to -31) dB

(-50 to -41) dB

(-60 to -51) dB

(-70 to -61) dB

(-80 to -71) dB

(-90 to -81) dB

0.019 dB

0.022 dB

0.027 dB

0.032 dB

0.037 dB

0.055 dB

0.06 dB

0.064 dB

0.069 dB

Agilent N5531S

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Attenuation1 – Measure 100 kHz to 31.15 GHz

100 kHz to 26.5 GHz

100 kHz to 3.05 GHz

(-100 to -91) dB

(-110 to -101) dB

(-120 to -111) dB

0.074 dB

0.086 dB

0.091 dB

Agilent N5531S

Amplitude Modulation1 – Measure 100 kHz to 10 MHz

10 MHz to 3 GHz

10 MHz to 3 GHz

(3 to 26.5) GHz

(3 to 26.5) GHz

(26.5 to 31.5) GHz

(26.5 to 31.5) GHz

(31.5 to 50) GHz

(31.5 to 50) GHz

(5 to 99) % Depth

(5 to 20) % Depth

(20 to 99) % Depth

(5 to 20) % Depth

(20 to 99) % Depth

(5 to 20) % Depth

(20 to 99) % Depth

(5 to 20) % Depth

(20 to 99) % Depth

1 % Depth

2.9 % Depth

0.8 % Depth

5.2 % Depth

1.8 % Depth

7.9 % Depth

2.3 % Depth

30 % Depth

7 % Depth

Agilent N5531S

Frequency Modulation1 – Measure

250 kHz to 10 MHz

10 MHz to 6.6 GHz

(6.6 to 13.2) GHz

(13.2 to 31.15) GHz

(31.15 to 50) GHz

20 Hz to 10 kHz

(50 to 200) Hz

3.1 % of reading

3.1 % of reading

3.8 % of reading 5 % of reading

11 % of reading

Agilent N5531S

Phase Modulation1 – Measure

100 kHz to 50 GHz

9.7 % of reading

Agilent N5531S

AM Distortion1 – Measure

(0.1 to 10) MHz

10 MHz to 26.5 GHz

(26.5 to 50) GHz

0.8 % of reading 1 % of reading

6.2 % of reading

Agilent N5531S

FM Distortion1 – Measure

1 MHz to 50 GHz

0.3 % of reading

Agilent N5531S

Attenuation Generate 30 MHz

30 MHz

30 MHz

30 MHz

30 MHz

10 dB

20 dB

30 dB

40 dB

50 dB

5.6 mdB

7.6 mdB

6.4 mdB

7.4 mdB

8.6 mdB

HP 11812A

RF Power1 – Measure 50 MHz

1.0 mW

0.0032 mW

HP 478A/Opt H76

RF Power1 – Measure

100 kHz-4.2 GHz

(-30 to 0.01) dBm

(0.01 to 20) dBm

1.1 % of reading

HP 8482A-H84

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

RF Power1 – Measure 10 MHz-18 GHz

(-30 to -0.01) dBm

(0.01 to 20) dBm

1.3 % of reading

HP 8481A-H84

RF Power1 – Measure

10 MHz-26.5GHz

(-20 to -0.01) dBm

0.01 to 30) dBm

4.7 % of reading

Agilent N5531S

RF Power1 – Measure 100 kHz to 4.2 GHz

(0.01 to 44) dBm

4.1% of reading

HP 8482B

RF Power1 – Measure

50 MHz to 50 GHz

(-30 to -0.01) dBm

(0.01 to 20) dBm

2.7 % of reading

HP 8487A-H84

RF Power – Generate 10 Hz – 100 kHz

100 kHz – 10 MHz

10 MHz – 128 MHz

128 MHz – 300 MHz

(-48 to 24) dBm

(-48 to 24) dBm

(-74 to -48) dBm

(-94 to -74) dBm

(-48 to 24) dBm

(-84 to -48) dBm

(-94 to -84) dBm

(-130 to -94) dBm

(-48 to 20) dBm

(-74 to -48) dBm

(-84 to -74) dBm

(-94 to -84) dBm

(-130 to -94) dBm

0.035 dB

0.058 dB

0.23 dB

0.58 dB

0.058 dB

0.12 dB

0.35 dB

0.81 dB

0.081 dB

0.12 dB

0.35 dB

0.58 dB

1.8 dB

Fluke 9640A-LPNX

RF Power – Generate 300 MHz – 1.4 GHz

1.4 GHz – 3 GHz

3 GHz – 4 GHz

(-48 to 20) dBm

(-74 to -48) dBm

(-84 to -74) dBm

(-94 to -84) dBm

(-130 to -94) dBm

(-48 to +14) dBm

(-74 to -48) dBm

(-94 to -74) dBm

(-130 to -94) dBm

(-17 to 14) dBm

(-74 to -17) dBm

(-84 to -74) dBm

0.23 dB

0.46 dB

0.58 dB

1.2 dB

1.8 dB

0.35 dB

0.58 dB

1.2 dB

1.8 dB

0.35 dB

0.58 dB

1.2 dB

Fluke 9640A-LPNX

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Phase Noise1 – SSB Measure

1 MHz to 50 GHz

0.39 dB

Agilent E4448A

AM/FM Distortion1

20 Hz to 20 kHz

1.2 dB

HP 8903B

Harmonic Distortion 20 Hz to 20 kHz

20 kHz to 50 GHz

(0 to -120) dB

1.2 dB

1.2 dB

HP 8903B

Agilent E4448

LISN and CDN Impedance

LISN and CDN Phase*

*(dependent on reflection magnitude)

Insertion Loss

9 kHz – 500 MHz

0.1 Ω to 5 kΩ

(-180 to 180) °

(-30 to 10) dB

(-40 to -30) dB

(-50 to -40) dB

(-50 to -40) dB

(-70 to -60) dB

(-80 to -70) dB

1.7% of reading

1.4 °

0.034 dB

0.062 dB

0.12 dB

0.35 dB 1 dB

3.5 dB

8751A System w/ 87511A and 85032B

CISPR 16-1-1 Pulse

Band A

(9 to 150) kHz Band B

(0.15 to 30) MHz

Band C & D (30 to 1 000) MHz

(-80 to 80) dB

(-80 to 80) dB

(-80 to 80) dB

0.65 dB

0.65 dB

1.1 dB

Schwarzbek IGUU-2918

Return Loss (VSWR) 5 Hz to 45 MHz

45 MHz to 50 GHz

(0 to 120) dB

(0 to 120) dB

1.1 dB

0.41 dB

HP 8751A HP 85107B

ESD Simulator

Current Measure Current Rise Time

(0.02 to 50) A

10 ps to 10 ms

4% of reading

3.2 ps + 25 µs/s

Tektronix CSA7404B w/ Haefely PET 4000

EFT/Burst Generator Duration Measure

Risetime Measure Amplitude Measure

(0.05 to 1 000) µs

0.3 ns to 100 ms 10 V to 8 kV

290 µs/s

0.2 ns + 290 µs/s

3.3% of reading

Lecroy 7100A w/ Teseq CAS 3025 EFT attenuator set

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Gage Blocks2

Up to 20 in

(1.7+2.1L) μin

Master gage blocks, P&W universal measuring

machine

Micrometers1,2

Up to 40 in

(32 + 4L) μin

Gage blocks (grade 2)

Calipers1,2

Up to 40 in

(48 + 7.2L) μin

Gage blocks (grade 2)

Dial Indicators1,2

Up to 10 in

(86 + 46L) μin

Gage blocks (grade 2)

Height Gages1,2

Up to 40 in

(194 + 3L) μin

Gage blocks (grade 2)

Protractors1

(0 to 360) °

0.01 °

Angle blocks

Rulers1

Up to 46 in

0.009 in

Gage blocks (grade 2)

Feeler Gage1

Up to 1 in

74 µin

Pratt & Whitney Supermicrometer C

Cylindrical Gages1,2 – Plain Pin, Plugs, Rings

(0.04 to 14) in

(8 + 2D) μin

Master gage blocks, P&W universal measuring machine

Cylindrical Gages1,2 – Plain Rings

(0 to 13) in

(2 + 3D) μin

Thread Plugs1 – Major Diameter

Pitch Diameter

Up to 12 in Up to 12 in

40 μin

91 μin

B & S 599-246-00, Van

Keuren thread wire set

Gage blocks, Pratt & Whitney Labmaster

Thread Rings

Up to 12 in

107 μin

Pratt & Whitney

Labmaster, Thread setting plug gages

Thread Wires

Up to 0.5D

10 μin

Master gage blocks, P&W

universal measuring machine

Surface Plates1 – Overall Flatness

Local Area Flatness

Up to 6 ft 6 ft Up to 18 x 18 in

95 μin

74 uin

Planekator Repeat-O-Meter

Optical Comparators1 – Linearity

Magnification

Up to 20 in (20 to 40) in

(10 to 100) x

590 μin

790 μin

590 μin

Gage blocks, SI Industries glass scales

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Coating Thickness Gages1,2

Eddy Current & Magnetic Induction

(0.737 to 100) mils

(100 to 243) mils

26 μin

240 μin

Coating thickness standards

Coating Thickness Shims

(0 to 243) mils

90 μin

Pratt & Whitney Supermicrometer C

Mass

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Scales & Balances1,2

(1 to 20) g

(20 to 200) g

(200 to 5 000) g

(11 to 100) lb

0.09 mg + 0.6R

0.58 mg + 0.6R 14 mg + 0.6R

0.06 g + 0.6R

Class 1 weights

Up to 1 000 lb

55 g + 0.6R

Class F weights

Force – Tension and Compression1

(0.5 to 500) lbf

0.09 % of reading

Class F weights

(200 to 10 000) lbf

(10 000 to 25 000) lbf

(25 000 to 50 000) lbf

0.011 % of reading

Morehouse Press with Load Cells

Pressure1

(0 to 24) inH2O

0.0025 inH2O

Dwyer 1425-25

(-15 to 200) psi

(0 to 1 000) psi

0.013 % of reading or 0.003 9% of reading of PPC4 Span

(whichever is greater)

Fluke PPC4

(10 to 16 000) psi

0.019 % of reading

Fluke P3125-PSI

Dead Weight Tester

Gas Flow

(1 to 10 000) sccm

(10 000 to 100 000) sccm

0.29 % of reading

0.64 % of reading

Molbloc flow standards

Torque Tools1

(16 to 64) ozf-in

64 ozf-in to 1 000 lbf-ft

1.5% of reading

0.32% of reading

Mountz S320

Torque Analyzers1

1 lbf-in to 1 000 lbf-ft

0.1% of reading

CDI 5000 ST

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Indirect Verification of Rockwell Hardness Testers1

(40 to 59) HRBW

(59.1 to 79) HRBW

(79.1 to 100) HRBW

(25 to 30) HRC

(35 to 55) HRC

(59 to 65) HRC

(70 to 79) HR15EW

(84 to 90) HR15EW

(93 to 100) HR15EW

(74 to 80) HR15TW

(81 to 86) HR15TW

(87 to 93) HR15TW

1.9 HRBW

1.3 HRBW

1.3 HRBW

1.3 HRC

1.3 HRC

0.73 HRC

1.3 HREW

1.3 HREW

1.3 HREW

1.8 HR15TW

1.3 HR15TW

1.3 HR15TW

Indirect verification per ASTM E18

Mass

(1, 2, 5) g

10 g

20 g

50 g

100 g

200 g

500 g

1 kg

5 kg

0.03125 oz

0.0625 oz

0.125 oz

0.25 oz

0.5 oz (0.001, 0.002) lb

(0.005, 0.01, 0.02) lb

0.05 lb

    1. lb

    2. lb (0.5, 1, 2) lb

5 lb

10 lb

25 lb

50 lb

0.09 mg

0.09 mg

0.09 mg

0.33 mg

0.53 mg

0.73 mg 29 mg 30 mg 30 mg

0.18 mg

0.18 mg

    1. mg

    2. mg

0.19 mg

    1. mg

    2. mg

0.31 mg

0.31 mg

0.36 mg 31 mg 31 mg

0.11 g

0.16 g

0.16 g

Comparison to ASTM E617 Class 1 weights

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Relative Humidity Generate

(10 to 95) % RH

0.51 % RH

Thunder Scientific 2500

Relative Humidity Measure

(0 to 90) % RH

(90 to 100) % RH

1.2 % RH 2 % RH

Vaisala MI70/HMP76

Temperature – Measure1

(-25 to 600) C

0.025 C

Hart 1502A with 5616 PRT

(800 to 1 550) ºC

2 ºC

Type B Thermocouple

IR Thermometry1

(50 to 100) ºC

(100 to 300) ºC

(300 to 500) ºC

0.51 ºC

0.61 ºC

0.8 ºC

Fluke 9132

Time and Frequency

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Frequency – Measure

10 MHz

1 x 10-11 Hz/Hz

58503A/B GPS

Frequency – Measure1

10 Hz to 46 GHz

(46 to 50) GHz

1 x 10-9 Hz/Hz

1 x 10-8 Hz/Hz

HP 53152A, E4448A

Calibration and Measurement Capability (CMC) is expressed in terms of the measurement parameter, measurement range, expanded uncertainty of measurement and reference standard, method, and/or equipment. The expanded uncertainty of measurement is expressed as the standard uncertainty of the measurement multiplied by a coverage factor of 2 (k=2), corresponding to a confidence level of approximately 95%.

Notes:

  1. On-site calibration service is available for this parameter, since on-site conditions are typically more variable than those in the laboratory, larger measurement uncertainties are expected on-site than what is reported on the accredited scope.

  2. L = length in inches, 1 mil = 0.001 inch, D = diameter in inches, t = time in seconds, R = resolution of device under test.

  3. This scope is formatted as part of a single document including Certificate of Accreditation No. AC-2080.


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