Temple Terrace, FL Certification

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z540-1-1994 AND ANSI/NCSL Z540.3-2006

Technical Maintenance, Inc.
12530 Telecom Drive
Temple Terrace, FL 33637
Scott Chamberlain Phone: 813-978-3054

CALIBRATION

Valid to: September 20, 2018 Certificate Number: AC-2080

Chemical

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

pH meters3 (4, 7, 10) pH 0.02 pH pH buffer solutions
Conductivity Meters3 2 µS

10 µS

100 µS

1 000 µS

10 000 µS

0.52 µS

0.42 µS

1.5 µS

10 µS

95 µS

Conductivity solutions

Dimensional

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Gage Blocks2 Up to 20 in (1.7+2.1L) µin Master gage blocks, P&W

universal measuring machine

Micrometers2,3 Up to 40 in (30 + 4L) µin Gage blocks (grade 2)
Calipers2,3 Up to 40 in (48 + 7.2L) µin Gage blocks (grade 2)
Dial Indicators2,3 Up to 10 in (86 + 46L) µin Gage blocks (grade 2)
Height Gages2,3 Up to 40 in (194 + 3L) µin Gage blocks (grade 2)
Protractors3 (0 to 360) ° 0.01 ° Angle blocks
Rulers3 Up to 46 in 0.009 in Gage blocks (grade 2)
Feeler Gage3 Up to 1 in 74 µin Pratt & Whitney

Supermicrometer C



Version 004 Issued: 05/25/2017 Page 1 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Dimensional

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Cylindrical Gages2 – Plain Pin, Plugs, Rings Internal Diameter

(0.04 to 14) in

Outside Diameter

(0 to 13) in

(8 + 2D) μin

(2 + 3D) μin

Master gage blocks, P&W universal measuring machine
Thread Plugs3

Major Diameter

Pitch Diameter

Up to 12 in

Up to 12 in

40 µin

91 µin

B & S 599-246-00, Van Keuren thread wire set Gage blocks, Pratt & Whitney Labmaster
Thread Rings Up to 12 in 57 µin Pratt & Whitney Labmaster,

Thread setting plug gages

Thread Wires Up to 0.5 in diameter 10 μin Master gage blocks, P&W

universal measuring machine

Surface Plates3 – Overall Flatness Only Up to 6 ft × 6 ft 50 μin Mahr federal leveling system
Optical Comparators3

Linearity

Magnification

Up to 20 in

(20 to 40) in

10x to 100x

590 μin

790 μin

590 μin

Gage blocks, SI Industries glass scales
Coating Thickness

Gages2,3

Eddy Current & Magnetic

Induction

Coating Thickness

Shims

(0.737 to 100) mils

(100 to 243) mils

(0 to 243) mils

26 μin

240 μin

90 μin

Coating thickness standards

Pratt & Whitney

Supermicrometer C

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

DC Current – Generate3 Up to 220 µA

220 µA to 2.2 mA

2.2 to 22 mA

22 to 220 mA

220 mA to 2.2 A

40 µA/A + 6 nA

35 µA/A + 7 nA

36 µA/A + 40 nA

48 µA/A + 0.7 µA

81 µA/A + 12 µA

Fluke 5730A
DC Current – Generate3 2.2 to 11 A 0.037% of reading + 480 µA Fluke 5730A/5725A
DC Current – Generate3 11 to 20.5 A 0.077% of reading + 750 μA Fluke 5520A
DC Current Clamp Meters (20.5 to 1 000) A 0.9 % of reading Fluke 5520A/Coil5500A



Version 004 Issued: 05/25/2017 Page 2 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

A



Version 004 Issued: 05/25/2017 Page 3 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

(22 to 220) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

220 mV to 2.2 V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(2.2 to 22) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

(300 to 500) kHz

500 kHz to 1 MHz

(22 to 220) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz

(20 to 50) kHz

(50 to 100) kHz

0.024 % of reading + 12 μV

90 μV/V + 7 μV

58 μV/V + 7 μV

0.012 % of reading + 7 μV

0.031 % of reading + 17 μV

0.066 % of reading + 20 μV

0.14 % of reading + 25 μV

0.27 % of reading + 45 μV

0.024 % of reading + 40 μV

90 μV/V + 15 μV

43 μV/V + 8 μV

67 μV/V + 10 μV

85 μV/V + 30 μV

0.034 % of reading + 80 μV

0.1 % of reading + 200 μV

0.17 % of reading + 300 μV

0.024 % of reading + 400 μV

91 μV/V + 150 μV

43 μV/V + 50 μV

67 μV/V + 100 μV

83 μV/V + 200 μV

0.025 % of reading + 600 μV

0.1 % of reading + 2000 μV

0.15 % of reading + 3200 μV

0.024 % of reading + 4 mV

90 μV/V + 1.5 mV

52 μV/V + 0.6 mV

80 μV/V + 1 mV

0.015 % of reading + 2.5 mV

Fluke 5730A/5725A
AC Voltage – Generate3 (220 to 750) V

40 Hz to 1 KHz

(1 to 20) kHz

(20 to 50) KHz

(50 to 100) kHz

(750 to 1 000) V

40 Hz to 1 KHz

(1 to 20) kHz

(20 to 30) KHz

91 μV/V + 4 mV

0.017 % of reading + 6 mV

0.06 % of reading + 11 mV

0.23 % of reading + 45 mV

91 μV/V + 4 mV

0.017 % of reading + 6 mV

0.06 % of reading + 11 mV

Fluke 5730A/5725A



Version 004 Issued: 05/25/2017 Page 4 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

AC Voltage – Measure3 Up to 2.2 mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

500 kHz to 1 MHz

(2.2 to 7) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

500 kHz to 1 MHz

(7 to 22) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

500 kHz to 1 MHz

(22 to 70) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

500 kHz to 1 MHz

0.13 % of reading + 1.3 μV

0.058 % of reading + 1.3 μV

0.034 % of reading + 1.3 μV

0.063 % of reading + 2 μV

0.093 % of reading + 2.5 μV

0.18 % of reading + 4 μV

0.18 % of reading + 8 μV

0.24 % of reading + 8 μV

0.065 % of reading + 1.3 μV

0.028 % of reading + 1.3 μV

0.016 % of reading + 1.3 μV

0.031 % of reading + 2 μV

0.046 % of reading + 2.5 μV

0.091 % of reading + 4 μV

0.099 % of reading + 8 μV

0.18 % of reading + 8 μV

0.022 % of reading + 1.3 μV

0.015 % of reading + 1.3 μV

84 μV/V + 1.3 μV

0.016 % of reading + 2 μV

0.024 % of reading + 2.5 μV

0.062 % of reading + 4 μV

0.068 % of reading + 8 μV

0.13 % of reading + 8 μV

0.018 % of reading + 1.5 μV

91 μV/V + 1.5 μV

50 μV/V + 1.3 μV

99 μV/V + 2 μV

0.02 % of reading + 2.5 μV

0.039 % of reading + 4 μV

0.051 % of reading + 8 μV

0.084 % of reading + 8 μV

Fluke 5790A



Version 004 Issued: 05/25/2017 Page 5 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

AC Voltage – Measure3 (70 to 220) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

500 kHz to 1 MHz

(220 to 700) mV

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

500 kHz to 1 MHz

700 mV to 2.2 V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

500 kHz to 1 MHz

(2.2 to 7) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

500 kHz to 1 MHz

(7 to 22) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

500 kHz to 1 MHz

0.016 % of reading + 1.5 μV

65 μV/V + 1.5 μV

31 μV/V + 1.3 μV

27 μV/V + 2 μV

0.012 % of reading + 2.5 μV

0.019 % of reading + 4 μV

0.029 % of reading + 8 μV

0.076 % of reading + 8 μV

0.022 % of reading + 1.5 μV

91 μV/V + 1.5 μV

60 μV/V + 1.3 μV

72 μV/V + 2 μV

94 μV/V + 2.5 μV

0.019 % of reading + 4 μV

0.031 % of reading + 8 μV

0.097 % of reading + 8 μV

0.015 % of reading

50 μV/V

20 μV/V

35 μV/V

54 μV/V

0.012 % of reading

0.02 % of reading

0.069 % of reading

0.015 % of reading

51 μV/V

19 μV/V

37 μV/V

63 μV/V

0.015 % of reading

0.031 % of reading

0.091 % of reading

0.015 % of reading

52 μV/V

22 μV/V

37 μV/V

62 μV/V

0.015 % of reading

0.031 % of reading

0.091 % of reading

Fluke 5790A



Version 004 Issued: 05/25/2017 Page 6 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

AC Voltage – Measure3 (22 to 70) V

(10 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz

(70 to 220) V

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz

(220 to 700) V

40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz

(700 to 1 000) V

40 Hz to 20 kHz

(20 to 30) kHz

0.015 % of reading

52 μV/V

25 μV/V

44 μV/V

72 μV/V

0.015 % of reading

0.015 % of reading

53 μV/V

24 μV/V

53 μV/V

75 μV/V

35 μV/V

0.01 % of reading

0.038 % of reading

33 μV/V

0.01 % of reading

Fluke 5790A
AC Voltage – Measure3 (1 to 85) kV

(50, 60) Hz

0.7 % of reading Ross VD120/ HP 34401A
AC Voltage – Measure3 (9 to 220) µA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(0.22 to 2.2) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(2.2 to 22) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(22 to 220) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

0.025 % of reading + 16 nA

0.016 % of reading + 10 nA

0.01 % of reading + 8 nA

0.028 % of reading + 12 nA

0.11 % of reading + 65 nA

0.025 % of reading + 40 nA

0.016 % of reading + 35 nA

0.01 % of reading + 35 nA

0.02 % of reading + 110 nA

0.011 % of reading + 650 nA

0.025 % of reading + 400 nA

0.016 % of reading + 350 nA

0.01 % of reading + 350 nA

0.02 % of reading + 550 nA

0.011 % of reading + 5 µA

0.025 % of reading + 4 μA

0.016 % of reading + 3.5 μA

0.01 % of reading + 2.5 μA

0.02 % of reading + 3.5 μA

0.11 % of reading + 10 μA

Fluke 5730A



Version 004 Issued: 05/25/2017 Page 7 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

AC Current – Generate3 (0.22 to 2.2) A

20 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

(2.2 to 11) A

40 Hz to 1 kHz

(1 to 5) kHz

(5 to 10) kHz

0.025 % of reading + 35 μA

0.045 % of reading + 80 μA

0.7 % of reading + 160 μA

0.046 % of reading + 170 μA

0.095 % of reading + 380 μA

0.36 % of reading + 750 μA

Fluke 5730A/5725A
AC Current – Generate3 (11 to 20.5) A

(45 to 100) Hz

100 Hz to 1 kHz

(1 Hz to 5) kHz

0.10 % of reading + 2 mA

0.12 % of reading + 5 mA

2.28 % of reading + 5 mA

Fluke 5520A
AC Current Clamp Meters (20.5 to 500) A

(45 to 440) Hz

1.8% of reading Fluke 5520A/coil
AC Current – Measure3 Up to 200 µA

(1 to 10) Hz

10 Hz to 10 kHz (10 to 30) kHz (30 to 100) kHz

200 µA to 2 mA

(1 to 10) Hz

10 Hz to 10 kHz (10 to 30) kHz (30 to 100) kHz

0.054 % of reading + 0.02 μA

0.054 % of reading + 0.02 μA

0.074 % of reading + 0.02 μA

0.4 % of reading + 0.02 μA

0.032 % of reading + 0.2 μA

0.031 % of reading + 0.2 μA

0.072 % of reading+ 0.2 μA

0.4 % of reading + 0.2 μA

Fluke 8508A
AC Current – Measure3 (2 to 22) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz (1 to 10) kHz (10 to 50) kHz

(22 to 220) mA

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz (1 to 10) kHz (10 to 50) kHz

(0.22 to 2.2) A

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz (1 to 10) kHz (10 to 50) kHz

(2.2 to 20) A

(10 to 20) Hz

(20 to 40) Hz

40 Hz to 1 kHz

(1 to 10) kHz

0.021 % of reading

0.012 % of reading

0.01 % of reading

0.01 % of reading

0.014 % of reading

0.045 % of reading

0.042 % of reading

0.041 % of reading

0.041 % of reading

0.019 % of reading

86 μA/A

54 μA/A

48 μA/A

76 μA/A

0.019 % of reading

97 μA/A

64 μA/A

60 μA/A

91 μA/A

Fluke 5790A / Holt

HCS-1 Current Shunts



Version 004 Issued: 05/25/2017 Page 8 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Resistance – Generate, Fixed

Points3

1 Ω

10 Ω

100 Ω

1 kΩ

10 kΩ

100 kΩ

1 MΩ

10 MΩ

19 MΩ

1.8 μΩ/Ω

1.7 μΩ/Ω

1.7 μΩ/Ω

1.1 μΩ/Ω

1.1 μΩ/Ω

1.3 μΩ/Ω

1.4 μΩ/Ω

5.4 μΩ/Ω

8.4 μΩ/Ω

Fluke 742A/ IET SRL
Resistance – Generate, Fixed

Points3

(1, 1.9) Ω

(10, 19) Ω (100, 190) Ω (1, 1.9) kΩ (10, 19) kΩ (100, 190) kΩ

1 MΩ

1.9 MΩ

10 MΩ

19 MΩ

100 MΩ

98 μΩ/Ω

23μΩ/Ω

10 μΩ/Ω

6.5 μΩ/Ω

6.5 μΩ/Ω

8.5 μΩ/Ω

13 μΩ/Ω

18 μΩ/Ω

40 μΩ/Ω

48 μΩ/Ω

100 μΩ/Ω

Fluke 5730A
Resistance – Generate3 Up to 11 Ω

(11 to 33) Ω (33 to 110) Ω (110 to 330) Ω

330 Ω to 1.1 kΩ (1.1 to 3.3) kΩ (3.3 to 11) kΩ (11 to 33) kΩ (33 to 110) kΩ (110 to 330) kΩ

0.33 MΩ to 1.1 MΩ (1.1 to 3.3) MΩ (3.3 to 11) MΩ (11 to 33) MΩ

(33 to 110) MΩ (110 to 330) MΩ

330 MΩ to 1.1 GΩ

40 μΩ/Ω + 0.01 Ω

30 μΩ/Ω + 0.015 Ω

28 μΩ/Ω + 0.015 Ω

28 μΩ/Ω + 0.02 Ω

29 μΩ/Ω + 0.02 Ω

29 μΩ/Ω + 0.2 Ω

29 μΩ/Ω + 0.1 Ω

29 μΩ/Ω + 1 Ω

29 μΩ/Ω + 1 Ω

33 μΩ/Ω + 10 Ω

33 μΩ/Ω + 10 Ω

60 μΩ/Ω + 150 Ω

0.013 % of reading + 250 Ω

0.025 % of reading + 2.5 kΩ

0.05 % of reading + 3.0 kΩ

0.3 % of reading + 100 kΩ

1.5 % of reading + 500 kΩ

Fluke 5520A
Resistance – Measure3

Fixed Points

1 Ω

10 Ω

100 Ω

1 kΩ

10 kΩ

100 kΩ

1 MΩ

10 MΩ

19 MΩ

10 μΩ/Ω

3.8 μΩ/Ω

1.9 μΩ/Ω

1.4 μΩ/Ω

1.5 μΩ/Ω

1.7 μΩ/Ω

2.7 μΩ/Ω

6.2 μΩ/Ω

15 μΩ/Ω

Fluke 8508A/ Fluke 742A/ IET SRL



Version 004 Issued: 05/25/2017 Page 9 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Resistance – Measure3

Fixed Points

Up to 2 Ω (2 to 20) Ω (20 to 200) Ω

200 Ω to 2 kΩ

(2 to 20) kΩ

(20 to 200) kΩ

200 kΩ to 2 MΩ

(2 to 20) MΩ

(20 to 200) MΩ

200 MΩ to 2 GΩ

(2 to 20) GΩ

19 μΩ/Ω + 4 µΩ

9.5 μΩ/Ω + 14 µΩ

8 μΩ/Ω + 50 µΩ

8 μΩ/Ω + 500 µΩ

8 μΩ/Ω + 5 mΩ

8 μΩ/Ω + 50 mΩ

9.2 μΩ/Ω + 1 Ω

17 μΩ/Ω + 10Ω

65 μ/Ω + 1KΩ

0.018 % of reading + 100 kΩ

0.15 % of reading + 10 MΩ

Fluke 8508A
Capacitance – Generate3 (0.19 to 0.1099) nF

(1.1 to 3.299) nF (3.3 to 329.999) nF (0.33 to 1.09999) μF (1.1 to 3.29999) μF (3.3 to 10.9999) μF (11 to 32.999) μF

(33 to 109.999) μF

(110 to 329.999) μF (0.33 to 1.09999) mF (1.1 to 3.2999) mF (3.3 to 10.9999) mF (11 to 32.9999) mF (33 to 110) mF

1.2 % of reading + 0.01 nF

1.2 % of reading + 0.01 nF

0.39 % of reading + 0.3 nF

0.38 % of reading + 3 nF

0.37 % of reading + 3 nF

0.38 % of reading + 10 nF

0.53 % of reading + 30 nF

0.58 % of reading + 100 nF

0.58 % of reading + 300 nF

0.57 % of reading + 1 μF

0.58 % of reading + 3 μF

0.59 % of reading + 10 μF

0.65 % of reading + 30 μF

1.3 % of reading + 100 μF

Fluke 5520A
Capacitance – Measure

12 Hz to 200 kHz

0.00001 pf to 99 999 µf 0.026 % of reading IET 1693
Capacitance – Generate3

Fixed Points

1 pF

10 pF

100 pf

1 000 pF

0.41 % of reading

017 % of reading

0.13 % of reading

0.32 % of reading

Agilent 16380A
Inductance – Measure

12 Hz to 200 kHz

0.01 µH to 99 999 H 0.025 % of reading IET 1693



Version 004 Issued: 05/25/2017 Page 10 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Inductance – Generate

1 kHz

0.07 µH

0.1 µH

0.28 µH

0.52 µH

1 µH

2.5 µH

5.2 µH

10 µH

28 µH

56 µH

100 µH

250 µH

520 µH

1 mH

2.8 mH

5.2 mH

10 mH

25 mH

52 mH

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

0.032 % of reading

Agilent 16470A
Oscilloscope Calibration – Vertic

Deflection3

50 Ω, 1 kHz square wave

1 MΩ, 1 kHz square wave

Flatness – Leveled Sine Wave

5 mV to 5.5 V Bandwidth

Rise Time

Time Interval2

1 mV to 6.6 V

1 mV to 130 V

50 kHz to 100 MHz (100 to 300) MHz (300 to 600) MHz (600 to 1100) MHz

<300 pS

1 nS to 20 mS

50 mS to 5 S

0.59 % of reading + 40 µV

0.44 % of reading + 40 µV

2.5 % of reading + 100 µV

2.2 % of reading + 100 µV

4.6 % of reading + 100 µV

6.4 % of reading + 100 µV

+ 13 pS / -110 pS

3 μS/S

(26 + 1 000t) μS/S

Fluke 5522A/SC1100
Power Meter Range Calibration3 3 μW to 100 mW 0.25 % of reading HP 11683A



Version 004 Issued: 05/25/2017 Page 11 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical DC/Low Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Electrical Calibration of Thermocouple Indicating Devices3

Type B Type C Type E Type J Type K Type L Type N

Type R

Type S Type T Type T

Type U

(600 to 1 820) °C (0 to 2 316) °C

(-250 to 1 000) °C (-210 to 1 200) °C (-200 to 1 372) °C (-200 to 900) °C

(-200 to 1 300) °C (0 to 1 767) °C

(0 to 1 767) °C

(-250 to -200) °C (-200 to 400) °C

(-200 to 600) °C

0.41 °C

0.38 °C

0.29 °C

0.19 °C

0.21 °C

0.12 °C

0.26 °C

0.45 °C

0.44 °C

0.41 °C

0.2 °C

0.19 °C

Fluke 7526A

Electrical RF/Microwave

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Flatness – Measure

Up to 7 V

(10 to 30) Hz

(30 to 120) Hz

120 Hz to 1.2 kHz

(1.2 to 120) kHz

(120 to 500) kHz

500 kHz to 1.2 MHz

(1.2 to 2) MHz

(2 to 10) MHz

(10 to 20) MHz

(20 to 30) MHz

30 MHz to 50 GHz

0.16 % of reading

0.04 % of reading

0.04 % of reading

0.04 % of reading

0.04 % of reading

0.06 % of reading

0.06 % of reading

0.11 % of reading

0.19 % of reading

0.43 % of reading

6 % of reading

Fluke 5790A

HP 8487A/8482A



Version 004 Issued: 05/25/2017 Page 12 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical RF/Microwave

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Attenuation3 – Measure

(0 to -10) dB

(-11 to -20) dB (-21 to -30) dB (-31 to -40) dB (-41 to -50) dB (-51 to -60) dB (-61 to -70) dB (-71 to -80) dB (-81 to -90) dB

(-91 to -100) dB

(-101 to -110) dB (-111 to -120) dB

10 MHz to 50 GHz

10 MHz to 50 GHz

10 MHz to 50 GHz

10 MHz to 50 GHz

10 MHz to 50 GHz

10 MHz to 50 GHz

10 MHz to 50 GHz

10 MHz to 45 GHz

10 MHz to 41 GHz

10 MHz to 31.15 GHz

10 MHz to 26.5 GHz

10 MHz to 3.05 GHz

0.06 dB

0.06 dB

0.06 dB

0.06 dB

0.06 dB

0.07 dB

0.06 dB

0.08 dB

0.08 dB

0.08 dB

0.08 dB

0.08 dB

Agilent N5531S
Amplitude

Modulation3 – Measure

(5 to 99) % Depth (5 to 20) % Depth (20 to 99) % Depth (5 to 20) % Depth (20 to 99) % Depth (5 to 20) % Depth (20 to 99) % Depth (5 to 20) % Depth (20 to 99) % Depth

100 kHz to 10 MHz

10 MHz to 3 GHz

10 MHz to 3 GHz

(3 to 26.5) GHz

(3 to 26.5) GHz

(26.5 to 31.5) GHz

(26.5 to 31.5) GHz

(31.5 to 50) GHz

(31.5 to 50) GHz

1 % Depth

2.9 % Depth

0.8 % Depth

5.2 % Depth

1.8 % Depth

7.9 % Depth

2.3 % Depth

30 % Depth

6 % Depth

Agilent N5531S
Frequency Modulation3 –

Measure

20 Hz to 10 kHz

(50 to 200) Hz

250 kHz to 10 MHz

10 MHz to 6.6 GHz (6.6 to 13.2) GHz (13.2 to 31.15) GHz (31.15 to 50) GHz

3.1 % of reading

3.1 % of reading

3.8 % of reading

5.0 % of reading

11 % of reading

Agilent N5531S
Phase Modulation3 –

Measure

100 kHz to 50 GHz 9.7 % of reading Agilent N5531S
AM Distortion3 – Measure (0.1 to 10) MHz

10 MHz to 26.5 GHz

(26.5 to 50) GHz

0.8 % of reading

1 % of reading

6.2 % of reading

Agilent N5531S
FM Distortion3 – Measure 1 MHz to 50 GHz 0.3 % of reading Agilent N5531S
Attenuation Generate

10 dB

20 dB

30 dB

40 dB

50 dB

30 MHz

30 MHz

30 MHz

30 MHz

30 MHz

5.6 mdB

7.6 mdB

6.4 mdB

7.4 mdB

8.6 mdB

HP 11812A



Version 004 Issued: 05/25/2017 Page 13 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical RF/Microwave

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

RF Power3 – Measure

1.0 mW

(-30 to 20) dBm

(-20 to 30) dBm

(0 to 44) dBm

(-30 to 20) dBm

50 MHz

100 kHz-4.2 GHz

10 MHz-18 GHz

10 MHz-26.5GHz

100 kHz to 4.2 GHz

50 MHz to 50 GHz

0.0032 mW

1.1 % of reading

1.3 % of reading

4.7 % of reading

4.1% of reading

2.7 % of reading

HP 478A

HP 8482A-H84

HP 8481A-H84

Agilent N5531S HP 8482B

HP 8487A-H84

Phase Noise3 – SSB Measure 1 MHz to 50 GHz 0.39 dB Agilent E4448A
AM/FM Distortion3 20 Hz to 20 kHz 1.2 dB HP 8903B
Harmonic Distortion 20 Hz to 20 kHz

20 kHz to 50 GHz

1.2 dB

1.2 dB

HP 8903A

Agilent E4448

LISN and CDN Impedance

LISN and CDN Phase*

*(dependent on reflection magnitude)

Insertion Loss

9 kHz – 500 MHz

0.1 Ω to 5 kΩ

(-180 to 180) ° (-30 to 10) dB

(-40 to -30) dB (-50 to -40) dB (-50 to -40) dB (-60 to -70) dB (-70 to -80) dB

1.7% of reading

1.4 °

0.034 dB

0.062 dB

0.12 dB

0.35 dB

1 dB

3.5 dB

8751A System w/ 87511A and

85032B

CISPR 16-1-1 Pulse

Band A Band B

Band C

(9 to 150) kHz

(0.15 to 30) MHz

(30 to 1 000) MHz

0.65 dB

0.65 dB

1.1 dB

Schwarzbek

IGUU-2918

Return Loss (VSWR) 5 Hz to 45 MHz

45 MHz to 50 GHz

1.1 dB

0.41 dB

HP 8751A

HP 85107B

ESD Simulator

Current Measure

Current Rise Time

(0.02 to 50) A

10 pS to 10 mS

4% of reading

3.2 pS + 25 µS/S

Tektronix CSA7404B

w/ Haefely PET 4000



Version 004 Issued: 05/25/2017 Page 14 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

Electrical RF/Microwave

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

EFT/Burst Generator

Duration Measure

Risetime Measure

Amplitude Measure

(0.05 to 1 000) µS

0.3 nS to 100 mS

10 V to 8 kV

290 µS/S

0.2 nS + 290 µS/S

3.3% of reading

Lecroy 7100A

w/ Teseq CAS 3025

EFT attenuator set

Reflection Phase

Coaxial 50 Ω

45 MHz – 2.0 GHz

2.0 GHz – 20 GHz

20 GHz – 40 GHz

40 GHz – 50 GHz

(0 to 180) ° 0.32°

0.27°

0.39°

0.53°

HP 8510C HP 85056A

V. Mechanical

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Scales & Balances2,3 (1 to 20) g (20 to 200) g (200 to 5000) g (11 to 100) lb

Up to 1 000 lb

0.08 mg + 0.6R

0.29 mg + 0.6R

14 mg + 0.6R

0.06 g + 0.6R

0.25% of reading + 0.6R

Class 1 weights

Class F weights

Force – Tension and

Compression3

(0.5 to 500) lbf

(200 to 2 000) lbf (10 000 to 25 000) lbf (25 000 to 50 000) lbf

0.09 % of reading

0.011 % of reading

0.011 % of reading

0.011 % of reading

Class F weights

Morehouse Press with Load

Cells

Pressure3 (0 to 24) inH2O

(-15 to 200) psi

(0 to 1 000) psi

(10 to 16 000) psi

0.0025 inH2O

0.013 % of reading or 0.0039% of reading of PPC4 Span8

0.019 % of reading

Dwyer 1425-25

Fluke PPC4

Fluke P3125-PSI Dead Weight Tester

Gas Flow (1 to 10 000) sccm

(10 000 to 100 000) sccm

0.29 % of reading

0.64 % of reading

Molbloc flow standards
Torque3

Torque Analyzers

4 lbf⋅in to 1 000 lbf⋅ft

1 lbf⋅in to 1 000 lbf⋅ft

0.32 % of reading

0.1 % of reading

CDI 5000 ST torque tester

Class F weights and arm



Version 004 Issued: 05/25/2017 Page 15 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

V. Mechanical

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Indirect Verification of Rockwell

Hardness Testers3

(40 to 59) HRBW (59.1 to 79) HRBW (79.1 to 100) HRBW

(25 to 30) HRC (35 to 55) HRC (59 to 65) HRC

(70 to 79) HR15EW (84 to 90) HR15EW (93 to 100) HR15EW

(74 to 80) HR15TW (81 to 86) HR15TW (87 to 93) HR15TW

1.9 HRBW

1.3 HRBW

1.3 HRBW

1.3 HRC

1.3 HRC

0.73 HRC

1.3 HREW

1.3 HREW

1.3 HREW

1.8 HR15TW

1.3 HR15TW

1.3 HR15TW

Indirect verification per ASTM E18
Mass (1, 2, 5) g

10 g

20 g

50 g

100 g

200 g

500 g

1 kg

5 kg

0.03125 oz

0.0625 oz

0.125 oz

0.25 oz

0.5 oz

(0.001, 0.002) lb

(0.005, 0.01, 0.02) lb

0.05 lb

0.1 lb

0.2 lb

(0.5, 1, 2) lb

5 lb

10 lb

25 lb

50 lb

0.09 mg

0.09 mg

0.09 mg

0.37 mg

0.53 mg

0.73 mg

29 mg

30 mg

30 mg

0.18 mg

0.18 mg

0.18 mg

0.19 mg

0.19 mg

0.09 mg

0.09 mg

0.31 mg

0.31 mg

0.36 mg

31 mg

31 mg

0.11 g

0.16 g

0.16 g

Comparison to class 1 weights



Version 004 Issued: 05/25/2017 Page 16 of 17
500 Montgomery St. Suite 625│ Alexandria, VA 22314│703-836-0025 │ www.anab.org

VI. Thermodynamic

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Relative Humidity –

Generate

Measure

(10 to 98) % RH (0 to 90) % RH 0.51 % RH

1.7 % RH

Thunder Scientific 2500

Vaisala HM141/HMP46

Temperature – Measure3 (-25 to 600) °C (800 to 1 550) ºC 0.025 °C

2 ºC

Hart 1502A with 5616 PRT Type B probe
IR Thermometry3 (50 to 100) ºC (100 to 300) ºC

(300 to 500) ºC

0.51 ºC

0.61 ºC

0.8 ºC

Fluke 9132

VII. Time and Frequency

Parameter/ Equipment Range Calibration and Measurement

Capability

[Expressed as Uncertainty (±)]

Reference Standard or

Equipment

Frequency – Measure 10 MHz 1 x 10-11 Hz/Hz 58503A/B GPS
Frequency – Measure3 10 Hz to 46 GHz

(46 to 50) GHz

1 x 10-9 Hz/Hz

1 x 10-8 Hz/Hz

HP 53152A, E4448A

Notes:

1. Calibration and Measurement Capabilities (Expanded Uncertainties) are based on approximately a 95% of reading confidence interval, using a coverage of k=2.
2. L = length in inches, 1 mil = 0.001 inch, t = time in seconds, D = diameter in inches, R = resolution of the device under test.
3. On-site calibration service available for this measurement parameter.
4. This scope is formatted as part of a single document including Certificate of Accreditation No. AC-2080


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