Windsor, CT Certification

SCOPE OF ACCREDITATION TO ISO/IEC 17025:2005, ANSI/NCSL Z540-1-1994 (R2002) AND ANSI/NCSL Z540.3-2006 (R2013)

Technical Maintenance, Inc.
425 Hayden Station Road,
Suite B
Windsor, CT 06095
Scott Chamberlain 860-219-0046

CALIBRATION

Valid to: September 20, 2019 Certificate Number: AC-2080.04

Electrical – DC/Low Frequency

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

DC Voltage1 – Generate

Up to 330 mV 330 mV to 3.3 V

(3.3 to 33) V

(33 to 330) V

(100 to 1 000) V

24 µV/V + 1 µV

14 µV/V + 2 µV

15 µV/V + 20 µV

22 µV/V + 0.15 mV

22 µV/V + 1.5 mV

Fluke 5522A

DC Voltage1– Measure

Up to 100 mV 100 mV to 1 V

(1 to 10) V

(10 to 100) V

(100 to 1 000) V

17 µV/V + 0.3 µV

12 µV/V + 0.3 µV

11 µV/V + 0.5 µV

52 μV/V + 30 µV

61 μV/V + 0.1 mV

HP 3458A

(1 to 60) kV

0.12 % of reading

Ross VD60-6.2Y-A-LB- AL

DC Current – Generate1

Up to 330 µA 330 µA to 3.3 mA

(3.3 to 33) mA

(33 to 330) mA

330 mA to 1.1 A

(1.1 to 3) A

(3 to 11) A

(11 to 20.5) A

0.18 mA/A + 0.02 µA

0.12 mA/A + 0.05 µA

0.12 mA/A + 0.25 µA

0.24 mA/A + 2.5 µA

0.24 mA/A + 40 μA

0.44 mA/A + 40 μA

0.6 mA/A + 0.5 mA

1.6 mA/A + 0.75 mA

Fluke 5522A

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

DC Current – Measure

Up to 100 nA 100 nA to 1 µA

(1 to 10) µA

(10 to 100) µA

100 µA to 3mA (10 to 100) mA

1 mA to 1 A

35 µA/A + 0.04 nA

24 µA/A + 0.04 nA

24 µA/A + 0.1 nA

24 µA/A + 0.8 nA

24 µA/A + 0.05 nA

42 µA/A + 0.5 µA

0.15 mA/A + 10 µA

HP 3458A

AC Voltage – Generate1

(1 to 33) mV

(10 to 45) Hz

45 Hz to 10 kHz

(10 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 500) kHz

(33 to 330) mV

(10 to 45) Hz

45 Hz to 10 kHz

(10 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 500) kHz

330 mV to 3.3 V

(10 to 45) Hz

45 Hz to 10 kHz

(10 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 500) kHz

0.95 mV/V + 6 μV

0.19 mV/V + 6 μV

0.24 mV/V + 6 μV

1.2 mV/V + 6 μV 4 mV/V + 12 μV

9.3 mV/V + 50 μV

0.35 mV/V + 8 μV

0.17 mV/V + 8 μV

0.19 mV/V + 8 μV

0.41 mV/V + 8 μV

0.93 mV/V + 32 μV

2.3 mV/V + 70 μV

0.35 mV/V + 50 μV

0.18 mV/V + 60 μV

0.22 µV/V + 60 μV

0.35 mV/V + 50 μV

0.81 mV/V + 0.13 mV

2.8 mV/V + 0.6 mV

Fluke 5522A

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Voltage – Generate1

(3.3 to 33) V

(10 to 45) Hz

45 Hz to 10 kHz

(10 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(33 to 330) V

45 Hz to 1 kHz

(1 to 10) kHz

(10 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(330 to 1 020) V

45 Hz to 10 kHz

0.36 mV/V + 0.65 mV

0.2 mV/V + 0.6 mV

0.47 mV/V + 0.6 mV

0.42 mV/V + 0.6 mV 1 mV/V + 1.6 mV

0.85 mV/V + 2 mV

0.85 mV/V + 6 mV

0.87 mV/V + 6 mV

0.9 mV/V + 6 mV

2.5 mV/V + 50 mV

8.2 mV/V + 10 mV

Fluke 5522A

AC Voltage – Measure

Up to 10 mV

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

10 mV to 100 mV

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(1 to 2) MHz

100 mV to 1 V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(1 to 2) MHz

0.044 % of reading + 0.003 mV

0.026 % of reading + 0.0011 mV

0.044 % of reading + 0.0011 mV

0.11 % of reading + 0.0011 mV

0.5 % of reading + 0.0011 mV 4 % of reading + 0.002 mV

0.019 % of reading + 0.004 mV

0.019 % of reading + 0.002 mV

0.027 % of reading + 0.002 mV

0.045 % of reading + 0.002 mV

0.09 % of reading + 0.002 mV

0.31 % of reading + 0.01 mV 1 % of reading + 0.01 mV

1.5 % of reading + 0.01 mV

0.019 % of reading + 0.04 mV

0.019 % of reading + 0.02 mV

0.027 % of reading + 0.02 mV

0.045 % of reading + 0.02 mV

0.09 % of reading + 0.02 mV

0.31 % of reading + 0.1 mV 1 % of reading + 0.1 mV

1.5 % of reading + 0.1 mV

HP 3458A

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Voltage – Measure

1 V to 10 V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(1 to 2) MHz

(10 to 100) V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(100 to 300) kHz

300 kHz to 1 MHz

(100 to 700) V

(1 to 40) Hz

40 Hz to 1 kHz

(1 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

0.19 % of reading + 0.4 mV

0.019 % of reading + 0.2 mV

0.027 % of reading + 0.2 mV

0.045 % of reading + 0.2 mV

0.09 % of reading + 0.2 mV

0.31 % of reading + 1 mV 1 % of reading + 1 mV

1.5 % of reading + 1 mV

0.026 % of reading + 0.002 V

0.041 % of reading + 0.002 V

0.038 % of reading + 0.002 V

0.048 % of reading + 0.002 V

0.13 % of reading + 0.002 V

0.4 % of reading + 0.01 V

1.5 % of reading + 0.01 V

0.05 % of reading + 0.04 V

0.05 % of reading + 0.02 V

0.07 % of reading + 0.02 V

0.13 % of reading + 0.02 V

0.3 % of reading + 0.02 V

HP 3458A

(1 to 42) kV

Up to 60 Hz

0.6 % of reading

Ross VD60-6.2Y-A-LB- AL

AC Current – Generate1 40 Hz to 1 kHz

(29 to 330) µA

330 μA to 3.3 mA

(3.3 to 33) mA

(33 mA to 330) mA

330 mA to 1.1 A

(1.1 to 3) A

(3 to 11) A

(11 to 20.5) A

0.22 % of reading + 0.1 μA

0.13 % of reading + 0.15 μA

0.08 % of reading + 2 μA

0.08 % of reading + 20 μA

    1. % of reading + 0.1 mA

    2. % of reading + 0.1 mA

0.13 % of reading + 2 mA

0.18 % of reading + 5 mA

Fluke 5522A

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

AC Current – Measure

Up to 100 μA

(10 to 20) Hz

(20 to 45) Hz

45 Hz to 1 kHz

(0.1 to 1) mA

(10 to 20) Hz

(20 to 45) Hz

(45 to 100) Hz

100 Hz to 5 kHz

(5 to 20) kHz

(20 to 50) kHz

(50 to 100) kHz

(1 to 10) mA

(10 to 20) Hz

(20 to 45) Hz

(45 to 100) Hz

100 Hz to 5 Hz

(5 to 20) kHz

(20 to 50) kHz

(10 to 100) mA

(10 to 20) Hz

(20 to 45) Hz

(45 to 100) Hz

100 Hz to 5 Hz

(5 to 20) kHz

(20 to 50) kHz

(0.1 to 1) A

(10 to 20) Hz

(20 to 45) Hz

(45 to 100) Hz

100 Hz to 5 Hz

(5 to 20) kHz

(20 to 50) kHz

0.41 % of reading + 0.03 pA

0.16 % of reading + 0.03 pA

0.07 % of reading + 0.03 pA

0.41 % of reading + 0.2 mA

0.16 % of reading + 0.2 mA

0.069 % of reading + 0.2 mA

0.038 % of reading + 0.2 mA

0.069 % of reading + 0.2 mA

0.41 % of reading + 0.2 mA

0.56 % of reading + 1.5 mA

0.41 % of reading + 2 mA

0.16 % of reading + 2 mA

0.069 % of reading + 2 mA

0.038 % of reading + 2 mA

0.41 % of reading + 4 mA

0.56 % of reading + 15 mA

0.41 % of reading + 20 mA

0.16 % of reading + 20 mA

0.069 % of reading + 20 mA

0.038 % of reading + 20 mA

0.41 % of reading + 40 mA

0.56 % of reading + 150 mA

0.41 % of reading + 0.2 mA

0.16 % of reading + 0.2 mA

0.069 % of reading + 0.2 mA

0.038 % of reading + 0.2 mA

0.31 % of reading + 0.2 mA 1 % of reading + 0.4 mA

HP 3458A

Resistance – Generate1

Up to 11 Ω

(11 to 33) Ω

(33 to 110) Ω

(110 to 330) Ω

330 Ω to 1.1 kΩ

51 μΩ/Ω + 0.01 Ω

42μΩ/Ω + 0.015 Ω

34 μΩ/Ω + 0.015 Ω

33 μΩ/Ω + 0.02 Ω

34 μΩ/Ω + 0.02 Ω

Fluke 5522A

 

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Resistance – Generate1

(1.1 to 3.3) kΩ

(3.3 to 11) kΩ

(11 to 33) kΩ

(33 to 110) kΩ

(110 to 330) kΩ

0.33 MΩ to 1.1 MΩ (1.1 to 3.3) MΩ (3.3 to 11) MΩ (11 to 33) MΩ (33 to 110) MΩ

(110 to 330) MΩ

330 MΩ to 1.1 GΩ

34 μΩ/Ω + 0.2 Ω

34 μΩ/Ω + 0.1 Ω

34 μΩ/Ω + 1 Ω

34 μΩ/Ω + 1 Ω

41 μΩ/Ω + 10 Ω

39 μΩ/Ω + 10 Ω

71 μΩ/Ω + 150 Ω

150 μΩ/Ω + 250 Ω

300 μΩ/Ω + 2.5 kΩ

610 μΩ/Ω + 3 kΩ

3.5 mΩ/Ω + 0.1 MΩ 17 mΩ/Ω + 0.5 MΩ

Fluke 5522A

Resistance – Measure

Up to 10 Ω

(10 to 100) Ω

100 Ω to 1 kΩ

(1 to 10) kΩ

(10 to 100) kΩ 100 kΩ to 1MΩ (1 to 10) MΩ

(10 to 100) MΩ

100 MΩ to 1 GΩ

27 μΩ/Ω + 50 μΩ

18 μΩ/Ω + 0.5 mΩ

15 μΩ/Ω + 0.5 mΩ

  1. μΩ/Ω + 0.5 mΩ

  2. μΩ/Ω + 50 mΩ

26 μΩ/Ω + 2 Ω

70 μΩ/Ω + 100 Ω

590 μΩ/Ω + 1 kΩ

0.78 % of reading + 10 kΩ

HP 3458A

Electrical Calibration of Thermocouple Indicating Devices1

Type E

(230 to 1 000) ºC

Type J

(-210 to 1 200) ºC

Type K

(-200 to 1 372) ºC

Type T

(-250 to 400) ºC

Type R

(0 to 1 767) ºC

Type S

(0 to 1 767) ºC

0.60 ºC

0.5 ºC

0.49 ºC

0.74 ºC

0.76 ºC

0.63 ºC

Fluke 5522A

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Capacitance – Generate

(0.19 to 0.1099) nF

(1.1 to 3.2999) nF

(3.3 to 329.999) nF

(0.33 to 1.09999) µF

(1.1 to 3.29999) µF

(3.3 to 10.9999) µF

(11 to 32.999) µF

(33 to 109.999) µF

(110 to 329.999) µF

(0.33 to 1.09999) mF

(1.1 to 3.2999) mF

(3.3 to 10.9999) mF

(11 to 32.9999) mF

(33 to 110) mF

1.2 % of reading + 0.01 nF

1.2 % of reading + 0.01 nF

0.38 % of reading + 0.3 nF

0.37 % of reading + 3 nF

    1. % of reading + 3 nF

    2. % of reading + 10 nF

0.53 % of reading + 30 nF

0.58 % of reading + 0.1 µF

0.58 % of reading + 0.3 µF

    1. % of reading + 1 μF

    2. % of reading + 3 μF

    3. % of reading + 10 μF

0.65 % of reading + 30 μF

1.3 % of reading + 0.1 mF

Fluke 5522A

Oscilloscopes1,2

Amplitude – Square Wave (peak to peak)

50 Ω

1 MΩ

Rise Time Flatness

(50 kHz reference)

Time Marker

1 mV to 6.6 V

1 mV to 130 V

<350 ps

5 mV to 5.5 V

50 kHz to 100 MHz

(100 to 300) MHz

(300 to 600) MHz

(600 to 1 100) MHz

1 nS to 20 mS

50 mS to 5 S

0.25 % of reading + 40 µV

0.1 % of reading + 40 µV

+ 13 ps / -0.120 ps

2.5 % of reading + 0.1 mV

3.4 % of reading + 0.1 mV

5.5 % of reading + 0.1 mV

6.9 % of reading + 0.1 mV

2.7 parts in 106 S

(25 + 1 000t) parts in 106 S

Fluke 5522A /SC1100

 

Length – Dimensional metrology

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Gage Blocks2

Up to 8 in

(5.2+ 2.3L) µin

Master gage blocks, P&W UMM

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Micrometers1,2

Up to 18 in

(29+ 5L) µin

Gage blocks

Laser Micrometer1

(0.5 to 1.5) in

170 µin

Pin Gages

Calipers1,2

Up to 20 in

(30 + 14L) µin

Gage blocks

Dial Indicators1

Up to 1 in

350 µin

Gage blocks

Cylindrical Gages2 – Rings

Plain Pins, Plugs

(0.02 to 8) in

(0 to 8) in

(6.5 + 1.6D) µin

(3 + 7D) µin

Master gage blocks, P&W UMM

Linear Scales – Rulers1

Up to 36 in

0.013 in

Gage blocks

Pi Tapes1

Up to 3 in

450 μin

Plug Gages

Tape Measures1

Up to 150 ft

0.19 in

Master tape

Microscopes1

Up to 2 in

100 µin

Stage Micrometer

 

Mass

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Scales & Balances1

(1 to 20) g

(20 to 200) g

(200 to 500) g

0.16 mg + 0.6R

1.4 mg + 0.6R 31 mg + 0.6R

ASTM E617 Class 1

weights

Up to 400 lb

21 g + 0.6R

NIST Class F weights

Pressure1

(-14 to 0) psig

Up to 1 000 psig

1.4 psig 1 psig

Fluke 700RG08 pressure gauge calibrator

Torque Wrenches1

4 lbfin to 250 lbfft

(250 to 1 000) lbfft

0.9 % of reading

1.3 % of reading

CDI 5000 ST torque tester

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Relative Humidity Generate

(10 to 98) %RH

0.51 %RH

Thunder Scientific 2500

Relative Humidity

Measure

(0 to 90) %RH

1.7 %RH

Vaisala M170/HMP75

Temperature – Measure1

(-25 to 0) °C

(0 to 140) °C

(140 to 600) °C

2.8 °C

0.21 °C

1.6 °C

Fluke 714 & 80PK-9 Fluke 2180A

Fluke 714 & 80PK-9

 

Time and Frequency

Parameter/Equipment

Range

Expanded Uncertainty of Measurement (+/-)

Reference Standard, Method, and/or Equipment

Frequency – Measure

10 MHz

1 x 10-11 Hz/Hz

Agilent 58503A/B GPS

Frequency – Measure1

0 to 100 MHz

2.1 x 10-7 Hz/Hz

HP 5334A

Calibration and Measurement Capability (CMC) is expressed in terms of the measurement parameter, measurement range, expanded uncertainty of measurement and reference standard, method, and/or equipment. The expanded uncertainty of measurement is expressed as the standard uncertainty of the measurement multiplied by a coverage factor of 2 (k=2), corresponding to a confidence level of approximately 95%.

Notes:

  1. On-site calibration service is available for this parameter, since on-site conditions are typically more variable than those in the laboratory, larger measurement uncertainties are expected on-site than what is reported on the accredited scope.

  2. L = length in inches, D = diameter in inches, R = resolution of device under test, t = time in seconds.

  3. This scope is formatted as part of a single document including Certificate of Accreditation No. AC-2080.04.

 


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